Tom Bonifield

According to our database, Tom Bonifield authored at least 5 papers between 2003 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

High Frequency TDDB of Reinforced Isolation Dielectric Systems.

Tom Bonifield, Honglin Guo, Jeff West, Hisashi Shichijo, Talha Tahir

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.

SangHoon Shin, Yen-Pu Chen, Woojin Ahn, Honglin Guo, Byron Williams, Jeff West, Tom Bonifield, Dhanoop Varghese, Srikanth Krishnan, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2005

BEOL variability and impact on RC extraction.

N. S. Nagaraj, Tom Bonifield, Abha Singh, Clive Bittlestone, Usha Narasimha, Viet Le, Anthony M. Hill

Proceedings of the 42nd Design Automation Conference, 2005

2004

Interconnect Modeling for Copper/Low-k Technologies.

N. S. Nagaraj, Tom Bonifield, Abha Singh, Roger Griesmer, Poras T. Balsara

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003

Benchmarks for Interconnect Parasitic Resistance and Capacitance.

N. S. Nagaraj, Tom Bonifield, Abha Singh, Frank Cano, Usha Narasimha, Mak Kulkarni, Poras T. Balsara, Cyrus D. Cantrell

Proceedings of the 4th International Symposium on Quality of Electronic Design (ISQED 2003), 2003