Yong Hyeon Yi

Orcid: 0000-0001-6834-000X

According to our database1, Yong Hyeon Yi authored at least 3 papers between 2022 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2023
Electromigration Assessment in Power Grids with Account of Redundancy and Non-Uniform Temperature Distribution.
Proceedings of the 2023 International Symposium on Physical Design, 2023

Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022


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