Zhuo Zhang

Affiliations:
  • I.M. Systems Group, Rockville, MD, USA
  • Iowa University, Iowa City, IA, USA (former)


According to our database1, Zhuo Zhang authored at least 6 papers between 2005 and 2014.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2014
On achieving minimal size test sets for scan designs.
it Inf. Technol., 2014

2007
Enhancing delay fault coverage through low-power segmented scan.
IET Comput. Digit. Tech., 2007

Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes.
Proceedings of the 12th Conference on Asia South Pacific Design Automation, 2007

2006
Scan Tests with Multiple Fault Activation Cycles for Delay Faults.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs.
Proceedings of the 2006 IEEE International Test Conference, 2006

2005
On Generating Pseudo-Functional Delay Fault Tests for Scan Designs.
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005


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