Alicja Malgorzata Michalowska-Forsyth

According to our database, Alicja Malgorzata Michalowska-Forsyth authored at least 12 papers between 2006 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Measurement Data - Total Ionizing Dose Effects on Variability in 40 nm Bulk CMOS Ring Oscillators.

Semih Ramazanoglu, Alicja Michalowska-Forsyth

Dataset, 2025

Measurement Data - Statistical Analysis of Total Ionizing Dose Effects on Random Telegraph Noise in 40 nm CMOS Ring Oscillators.

Semih Ramazanoglu, Alicja Michalowska-Forsyth

Dataset, 2025

Measurement Data - Ionizing radiation influence on 28-nm MOS transistor's low-frequency noise characteristics.

Alicja Michalowska-Forsyth, Martin Apro

Dataset, 2025

2024

Bias dependence in statistical random telegraph noise analysis based on nanoscale CMOS ring oscillators.

Semih Ramazanoglu, Alicja Michalowska-Forsyth, Bernd Deutschmann

Elektrotech. Informationstechnik, March, 2024

More than scaling: CMOS-integrated circuits in the third decade of the 21^st century.

Alicja Michalowska-Forsyth

Elektrotech. Informationstechnik, March, 2024

WIP: Building an Education Ecosystem for Next Generation Microelectronics Experts in Green and Circular Economy with Digitally-Supported Teaching Methods for Sustainable Chips and Applications (EU Project GreenChips-EDU).

Klaus Hofmann, Ferdinand Keil, David Riehl, Alicja Michalowska-Forsyth, Nikolaus Czepl, Sarah Woywod, Dominik Zupan, Mario R. Casu, Carlo Ricciardi, Massimo Violante, Mariagrazia Graziano, Yuri Ardesi, Fabrizio Mo, Dominik Berger, Sabine Sill, Volker Visotschnig, Panagiota Morfouli, Liliana Prejbeanu, Katell Morin-Allory, Cyrille Chavet, Davide Bucci, Skandar Basrour, Jean-Christophe Crebier, Nhu-Huan Nguyen, Ernesto Quisbert-Trujillo, Christian Defélix, Isabelle Corbett-Etchevers, Johannes Sturm, Jens Peter Konrath, Ulla Birnbacher, Thomas Klinger, Wolfgang Werth, Jorge Fernandes, Marcelino B. Santos, Antonio Rubio, Alba Pagès-Zamora, Josep Pegueroles, Jordi Salazar, Beatriz Otero, J. Manuel Moreno, X. Aragones, Israel Martin, Aleix Sole, Dunja Suttnig, Julia Calabro, Floriberto Lima, Eric Jouseau, François Cerisier, Cristian Rivier, Sepp Eisenriegler, Harald Reichl, Miroslav Macan, Dubravko Kruselj, Mladen Puskaric, Mirjana Tatalovic, Vinko Zelenicic, Bernd Deutschmann

Proceedings of the IEEE Frontiers in Education Conference, 2024

Effects of Ionizing Radiation on the EMI-Induced Offset Voltage of Operational Amplifiers.

Nikolaus Czepl, Dominik Zupan, Alicja Michalowska-Forsyth, Bernd Deutschmann

Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024

2019

Erratum to: Design and theoretical comparison of input ESD devices in 180 nm CMOS with focus on low capacitance.

Alicja Michalowska-Forsyth, Patrick Schrey, Bernd Deutschmann

Elektrotech. Informationstechnik, 2019

2018

Design and theoretical comparison of input ESD devices in 180 nm CMOS with focus on low capacitance.

Alicja Malgorzata Michalowska-Forsyth, Patrick Schrey, Bernd Deutschmann

Elektrotech. Informationstechnik, 2018

Aspect ratio of radiation-hardened MOS transistors - Modelling of the equivalent channel dimensions of integrated MOS transistors in radiation-hardened enclosed layout.

Varvara Bezhenova, Alicja Malgorzata Michalowska-Forsyth

Elektrotech. Informationstechnik, 2018

2016

Effects of ionizing radiation on integrated circuits.

Varvara Bezhenova, Alicja Malgorzata Michalowska-Forsyth

Elektrotech. Informationstechnik, 2016

2006

Contribution of Custom Instructions on SoPC for iris recognition application.

Thomas Ea, Frédéric Amiel, Alicja Michalowska, Florence Rossant, Amara Amara

Proceedings of the 13th IEEE International Conference on Electronics, 2006