Kevin McCauley

According to our database, Kevin McCauley authored at least 6 papers between 1992 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2006

Not all Delay Tests Are the Same - SDQL Model Shows True-Time.

Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin McCauley, Shuji Hamada, Yasuo Sato

Proceedings of the 15th Asian Test Symposium, 2006

2005

Practical Aspects of Delay Testing for Nanometer Chips.

Vivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

Low Overhead Delay Testing of ASICS.

Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

1998

ATPG in practical and non-traditional applications.

Brion L. Keller, Kevin McCauley, Joseph Swenton, James Youngs

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Delay test of chip I/Os using LSSD boundary scan.

Pamela S. Gillis, Francis Woytowich, Kevin McCauley, Ulrich Baur

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1992

Delay Test: The Next Frontier for LSSD Test Systems.

Bernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, T. Williams

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992