Dragoljub Gagi Drmanac

According to our database1, Dragoljub Gagi Drmanac authored at least 12 papers between 2008 and 2014.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.



In proceedings 
PhD thesis 


On csauthors.net:


Innovative practices session 5C: Machine learning and data analysis in test.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Understanding customer returns from a test perspective.
Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Forward prediction based on wafer sort data - A case study.
Proceedings of the 2011 IEEE International Test Conference, 2011

Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study.
Proceedings of the 2011 IEEE International Test Conference, 2011

Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.
Proceedings of the Design, Automation and Test in Europe, 2011

Mining AC delay measurements for understanding speed-limiting paths.
Proceedings of the 2011 IEEE International Test Conference, 2010

A non-parametric approach to behavioral device modeling.
Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Online selection of effective functional test programs based on novelty detection.
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch.
Proceedings of the 47th Design Automation Conference, 2010

Minimizing outlier delay test cost in the presence of systematic variability.
Proceedings of the 2009 IEEE International Test Conference, 2009

Predicting variability in nanoscale lithography processes.
Proceedings of the 46th Design Automation Conference, 2009

A Study of Outlier Analysis Techniques for Delay Testing.
Proceedings of the 2008 IEEE International Test Conference, 2008