Eduard Cartier

According to our database, Eduard Cartier authored at least 5 papers between 2013 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Reliability Challenges with Materials for Analog Computing.

Eduard A. Cartier, Wanki Kim, Nanbo Gong, Tayfun Gokmen, Martin M. Frank, Douglas M. Bishop, Youngseok Kim, Seyoung Kim, Takashi Ando, Ernest Y. Wu, Praneet Adusumilli, John Rozen, Paul M. Solomon, Wilfried Haensch, Matthew J. BrightSky, Abu Sebastian, Geoffrey W. Burr, Vijay Narayanan

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

PBTI in InGaAs MOS capacitors with Al2O3/HfO2/TiN gate stacks: Interface-state generation.

Eduard Cartier, Martin M. Frank, Takashi Ando, John Rozen, Vijay Narayanan

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Electron mobility in thin In0.53Ga0.47As channel.

Eduard Cartier, Atreya Majumdar, K.-T. Lee, Takashi Ando, Martin M. Frank, John Rozen, Keith A. Jenkins, C. Liang, C.-W. Cheng, John Bruley, M. Hopstaken, Pranita Kerber, J.-B. Yau, X. Sun, R. T. Mo, Chun-Chen Yeh, Effendi Leobandung, Vijay Narayanan

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2015

NBTI in Si0.5Ge0.5 RMG gate stacks - Effect of high-k nitridation.

P. Srinivasan, J. Fronheiser, S. Siddiqui, A. Kerber, L. F. Edge, Richard G. Southwick, Eduard Cartier

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2013

Improving and optimizing reliability in future technologies with high-κ dielectrics.

Barry P. Linder, Eduard Cartier, S. Krishnan, Ernest Y. Wu

Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013