Federico Faccio

According to our database, Federico Faccio authored at least 8 papers between 2000 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose.

Aristeidis Nikolaou, Loukas Chevas, Alexia Papadopoulou, Nikolaos Makris, Matthias Bucher, Giulio Borghello, Federico Faccio

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

2018

A Reliability and Efficiency Optimization System for Hard-Switching DC/DC Converters.

Giacomo Ripamonti, Stefano Michelis, Federico Faccio, Stefano Saggini, Adil Koukab, Maher Kayal

Proceedings of the 16th IEEE International New Circuits and Systems Conference, 2018

Extending a 65nm CMOS process design kit for high total ionizing dose effects.

Aristeidis Nikolaou, Matthias Bucher, Nikos Makris, Alexia Papadopoulou, Loukas Chevas, Giulio Borghello, Henri D. Koch, Kostas Kloukinas, Tuomas S. Poikela, Federico Faccio

Proceedings of the 7th International Conference on Modern Circuits and Systems Technologies, 2018

Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS.

Loukas Chevas, Aristeidis Nikolaou, Matthias Bucher, Nikolaos Makris, Alexia Papadopoulou, Apostolos Zografos, Giulio Borghello, Henri D. Koch, Federico Faccio

Proceedings of the 25th International Conference "Mixed Design of Integrated Circuits and System", 2018

2016

Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC.

Alessandro Pezzotta, C.-M. Zhang, Farzan Jazaeri, Claudio Bruschini, Giulio Borghello, Federico Faccio, S. Mattiazzo, Andrea Baschirotto, Christian C. Enz

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2010

An 8W-2MHz buck converter with adaptive dead time tolerant to radiation and high magnetic field.

Stefano Michelis, Bruno Allongue, G. Blanchot, Simone Buso, Federico Faccio, Cristian Fuentes, Alessandro Marchioro, Stefano Orlandi, Stefano Saggini, Giorgio Spiazzi, Maher Kayal

Proceedings of the 36th European Solid-State Circuits Conference, 2010

2008

Total ionizing dose effects in shallow trench isolation oxides.

Federico Faccio, Hugh J. Barnaby, Xiao J. Chen, Daniel M. Fleetwood, Laura Gonella, Michael L. McLain, Ronald D. Schrimpf

Microelectron. Reliab., 2008

2000

Integrated circuits for particle physics experiments.

Walter Snoeys, Giovanni Anelli, Michael Campbell, Eugenio Cantatore, Federico Faccio, Erik H. M. Heijne, Senior Pierre Jarron, Kostas Kloukinas, Alessandro Marchioro, Paulo Moreira, Thomas Toifl, Kenneth Wyllie

IEEE J. Solid State Circuits, 2000