Michael Campbell

Orcid: 0000-0002-0739-8838

According to our database1, Michael Campbell authored at least 18 papers between 2000 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
Concussion Diagnostics: A New Diagnostic Approach Using PET Technology.
SN Comput. Sci., July, 2023

2021
Brightening Up Brain Injuries: Design, Synthesis and Characterization of a PET Diagnostic Agent for Neuronal Trauma.
Proceedings of the ICT for Health, Accessibility and Wellbeing, 2021

2019
Count time series prediction using particle filters.
Qual. Reliab. Eng. Int., 2019

2018
Gramene 2018: unifying comparative genomics and pathway resources for plant research.
Nucleic Acids Res., 2018

Predicting gene structure changes resulting from genetic variants via exon definition features.
Bioinform., 2018

2017
Improved maize reference genome with single-molecule technologies.
Nat., 2017

High-throughput interpretation of gene structure changes in human and nonhuman resequencing data, using ACE.
Bioinform., 2017

2015
Guest Editorial Special Issue on Spectral CT.
IEEE Trans. Medical Imaging, 2015

2014
Fracture prediction of cardiac lead medical devices using Bayesian networks.
Reliab. Eng. Syst. Saf., 2014

2013
ImagePlane: An Automated Image Analysis Pipeline for High-Throughput Screens Using the Planarian <i>Schmidtea mediterranea</i>.
J. Comput. Biol., 2013

2012
A program to increase female engineering and science enrollments through NSF STEM scholarships.
Proceedings of the IEEE Frontiers in Education Conference, 2012

2011
Artificial intelligence research at IBM.
IBM J. Res. Dev., 2011

2010
Plenary presentations: Keynote: The product complexity and test - How product complexity impacts test industry.
Proceedings of the 15th European Test Symposium, 2010

2009
The Future of Test - Product Integration and its Impact on Test.
Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

2005
Business constraints drive test decisions planning, partnerships and success.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Foundries, EDA vendors, and designers: who shoulders the blame when a design doesn't work in the nano-scale and wireless era?
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

2004
When IC yield missed the target, who is at fault?
Proceedings of the 41th Design Automation Conference, 2004

2000
Integrated circuits for particle physics experiments.
IEEE J. Solid State Circuits, 2000


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