M. B. González

Orcid: 0000-0001-6792-4556

According to our database1, M. B. González authored at least 11 papers between 2010 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2023
Variability in Resistive Memories.
Adv. Intell. Syst., June, 2023

True Random Number Generator Based on the Variability of the High Resistance State of RRAMs.
IEEE Access, 2023

2022
An enhanced Verilog-A compact model for bipolar RRAMs including transient thermal effects and series resistance.
Proceedings of the 37th Conference on Design of Circuits and Integrated Systems, 2022

2021
Simulation of serial RRAM cell based on a Verilog-A compact model.
Proceedings of the XXXVI Conference on Design of Circuits and Integrated Systems, 2021

2020
Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

A physically based SPICE model for RRAMs including RTN.
Proceedings of the XXXV Conference on Design of Circuits and Integrated Systems, 2020

2018
Device variability tolerance of a RRAM-based self-organizing neuromorphic system.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015
Electrical characterization of multiple leakage current paths in HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub>-based nanolaminates.
Microelectron. Reliab., 2015

2013
2 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al<sub>2</sub>O<sub>3</sub> dielectrics of different thickness.
Microelectron. Reliab., 2013

2012
Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs.
Microelectron. Reliab., 2012

2010
SPICE modelling of hot-carrier degradation in Si<sub>1-</sub><sub>x</sub>Ge<sub>x</sub> S/D and HfSiON based pMOS transistors.
Microelectron. Reliab., 2010


  Loading...