According to our database1, Hector Villacorta authored at least 12 papers between 2012 and 2020.
Legend:Book In proceedings Article PhD thesis Other
Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells.
Proceedings of the IEEE Latin-American Test Symposium, 2020
IEEE Trans. Very Large Scale Integr. Syst., 2019
An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018
J. Electron. Test., 2016
Proceedings of the 21th IEEE European Test Symposium, 2016
Low V<sub>DD</sub> and body bias conditions for testing bridge defects in the presence of process variations.
Microelectron. J., 2015
Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell.
Proceedings of the 16th Latin-American Test Symposium, 2015
Skew violation verification in digital interconnect signals based on signal addition.
IEICE Electron. Express, 2014
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
IEEE Des. Test, 2013
Proceedings of the 14th Latin American Test Workshop, 2013
Resistive bridge defect detection enhancement under parameter variations combining Low V<sub>DD</sub> and body bias in a delay based test.
Microelectron. Reliab., 2012