Hector Villacorta

According to our database, Hector Villacorta authored at least 16 papers between 2010 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations.

Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

2021

Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell.

Víctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas

J. Electron. Test., 2021

2020

Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells.

Zahira Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac

Proceedings of the IEEE Latin-American Test Symposium, 2020

2019

Modeling and Detectability of Full Open Gate Defects in FinFET Technology.

Freddy Forero, Hector Villacorta, Michel Renovell, Víctor H. Champac

IEEE Trans. Very Large Scale Integr. Syst., 2019

2018

TCAD analysis and modeling for NBTI mechanism in FinFET transistors.

Alfonso Herrera-Moreno, Jose Luis Garcia-Gervacio, Héctor Villacorta-Minaya, Héctor Vázquez-Leal

IEICE Electron. Express, 2018

An accurate novel gate-sizing metric to optimize circuit performance under local intra-die process variations.

Zahira Perez, Hector Villacorta, Víctor H. Champac

Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018

2016

Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability.

Hector Villacorta, Jaume Segura, Víctor H. Champac

J. Electron. Test., 2016

Behavior and test of open-gate defects in FinFET based cells.

Francisco Mesalles, Hector Villacorta, Michel Renovell, Víctor H. Champac

Proceedings of the 21th IEEE European Test Symposium, 2016

2015

Low V_DD and body bias conditions for testing bridge defects in the presence of process variations.

Hector Villacorta, Jose Luis Garcia-Gervacio, Jaume Segura, Víctor H. Champac

Microelectron. J., 2015

Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell.

Hector Villacorta, Roberto Gómez, Sebastià A. Bota, Jaume Segura, Víctor H. Champac

Proceedings of the 16th Latin-American Test Symposium, 2015

2014

Skew violation verification in digital interconnect signals based on signal addition.

Víctor H. Champac, Hector Villacorta, Nestor Hernandez, Joan Figueras

IEICE Electron. Express, 2014

Analysis of fin height on FinFET SRAM cell hardening.

Hector Villacorta, Jaume Segura, Sebastià A. Bota, Víctor H. Champac

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

2013

Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths.

Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez

IEEE Des. Test, 2013

Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias.

Hector Villacorta, Jose Luis Garcia-Gervacio, Víctor H. Champac, Sebastià A. Bota, Jaime Martínez-Castillo, Jaume Segura

Proceedings of the 14th Latin American Test Workshop, 2013

2012

Resistive bridge defect detection enhancement under parameter variations combining Low V_DD and body bias in a delay based test.

Hector Villacorta, Víctor H. Champac, Sebastià A. Bota, Jaume Segura

Microelectron. Reliab., 2012

2010

Reliability analysis of small delay defects in vias located in signal paths.

Hector Villacorta, Víctor H. Champac, Chuck Hawkins, Jaume Segura

Proceedings of the 11th Latin American Test Workshop, 2010