Hanno Hantson

According to our database, Hanno Hantson authored at least 7 papers between 2010 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Automated Design Error Localization in RTL Designs.

Maksim Jenihhin, Anton Tsepurov, Valentin Tihhomirov, Jaan Raik, Hanno Hantson, Raimund Ubar, Gunter Bartsch, Jorge Hernán Meza Escobar, Heinz-Dietrich Wuttke

IEEE Des. Test, 2014

2013

Automated design error debug using high-level decision diagrams and mutation operators.

Jaan Raik, Urmas Repinski, Anton Chepurov, Hanno Hantson, Raimund Ubar, Maksim Jenihhin

Microprocess. Microsystems, 2013

2012

On the Reuse of TLM Mutation Analysis at RTL.

Valerio Guarnieri, Giuseppe Di Guglielmo, Nicola Bombieri, Graziano Pravadelli, Franco Fummi, Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar

J. Electron. Test., 2012

Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis.

Hanno Hantson, Urmas Repinski, Jaan Raik, Maksim Jenihhin, Raimund Ubar

Proceedings of the 13th Latin American Test Workshop, 2012

Combining dynamic slicing and mutation operators for ESL correction.

Urmas Repinski, Hanno Hantson, Maksim Jenihhin, Jaan Raik, Raimund Ubar, Giuseppe Di Guglielmo, Graziano Pravadelli, Franco Fummi

Proceedings of the 17th IEEE European Test Symposium, 2012

2011

Mutation analysis for SystemC designs at TLM.

Valerio Guarnieri, Nicola Bombieri, Graziano Pravadelli, Franco Fummi, Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar

Proceedings of the 12th Latin American Test Workshop, 2011

2010

Mutation analysis with high-level decision diagrams.

Hanno Hantson, Jaan Raik, Maksim Jenihhin, Anton Chepurov, Raimund Ubar, Giuseppe Di Guglielmo, Franco Fummi

Proceedings of the 11th Latin American Test Workshop, 2010