Hugo Bender

According to our database, Hugo Bender authored at least 3 papers between 2001 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and output current drop.

Denis Marcon, John Viaene, Paola Favia, Hugo Bender, Xuanwu Kang, Silvia Lenci, Steve Stoffels, Stefaan Decoutere

Microelectron. Reliab., 2012

2008

Detection of failure sites by focused ion beam and nano-probing in the interconnect of three-dimensional stacked circuit structures.

Yu Yang, Hugo Bender, Kai Arstila, Bart Swinnen, Bert Verlinden, Ingrid De Wolf

Microelectron. Reliab., 2008

2001

In situ crystallisation in ZrO₂ thin films during high temperature X-ray diffraction.

Chao Zhao, Gert Roebben, Hugo Bender, Edward Young, S. Haukka, Michel Houssa, Mohamed Naili, Stefan De Gendt, Marc M. Heyns, Omer Van der Biest

Microelectron. Reliab., 2001