Hyunbean Yi

According to our database, Hyunbean Yi authored at least 19 papers between 2003 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2024

Sow Posture Analysis and Estrus Prediction Using Closed-Circuit Television Cameras.

Sookeun Song, Taegeun Kang, Kyungtae Lim, Konmin Kim, Hyunbean Yi

IEEE Access, 2024

2017

On Diagnosing the Aging Level of Automotive Semiconductor Devices.

Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park

IEEE Trans. Circuits Syst. II Express Briefs, 2017

2015

Efficient diagnosis technique for aging defects on automotive semiconductor chips.

Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park

Proceedings of the 20th IEEE European Test Symposium, 2015

2012

A Failure Prediction Strategy for Transistor Aging.

Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara

IEEE Trans. Very Large Scale Integr. Syst., 2012

2010

On-Chip Support for NoC-Based SoC Debugging.

Hyunbean Yi, Sungju Park, Sandip Kundu

IEEE Trans. Circuits Syst. I Regul. Pap., 2010

A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains.

Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park

IEEE Trans. Circuits Syst. II Express Briefs, 2010

Aging test strategy and adaptive test scheduling for SoC failure prediction.

Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

2009

An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge.

Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park

IEEE Trans. Circuits Syst. I Regul. Pap., 2009

Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults.

Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park

IEEE Trans. Circuits Syst. II Express Briefs, 2009

2008

Low-Cost Scan Test for IEEE-1500-Based SoC.

Hyunbean Yi, Jaehoon Song, Sungju Park

IEEE Trans. Instrum. Meas., 2008

Core Test Wrapper Design to Reduce Test Application Time for Modular SoC Testing.

Hyunbean Yi, Sandip Kundu

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC.

Hyunbean Yi, Sungju Park, Sandip Kundu

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Design of Test Access Mechanism for AMBA-Based System-on-a-Chip.

Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC.

Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park

Proceedings of the 16th Asian Test Symposium, 2007

An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips.

Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park

Proceedings of the Advances in Computer Systems Architecture, 2007

2006

Efficient Interconnect Test Patterns for Crosstalk and Static Faults.

Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains.

Hyunbean Yi, Jaehoon Song, Sungju Park

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Hybrid test data compression technique for SOC scan testing.

Sangwook Cho, Jaehoon Song, Hyunbean Yi, Sungju Park

Proceedings of the Proceedings 2005 IEEE International SOC Conference, 2005

2003

An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks.

Hyunbean Yi, Sungju Park, Misook Kim, Kiman Jeon

Proceedings of the Web Communication Technologies and Internet-Related Social Issues, 2003