Jeffrey Mayer

According to our database, Jeffrey Mayer authored at least 8 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology.

Ashrith S. Harith, Yingdi Liu, Nilanjan Mukherjee, Jeffrey Mayer

Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024

2021

Time and Area Optimized Testing of Automotive ICs.

Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

IEEE Trans. Very Large Scale Integr. Syst., 2021

2020

Effective Design of Layout-Friendly EDT Decompressor.

Yu Huang, Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Jeffrey Mayer

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

2019

Test Time and Area Optimized BrST Scheme for Automotive ICs.

Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki

Proceedings of the IEEE International Test Conference, 2019

2010

Symbolic identification of dynamical systems: Theory and experimental validation.

Subhadeep Chakraborty, Eric Keller, Asok Ray, Jeffrey Mayer

Proceedings of the American Control Conference, 2010

2007

Pattern identification in dynamical systems via symbolic time series analysis.

Venkatesh Rajagopalan, Asok Ray, Rohan Samsi, Jeffrey Mayer

Pattern Recognit., 2007

2006

Broken Rotor Bar detection using Symbolic Wavelet Analysis.

Rohan Samsi, Jeffrey Mayer, Asok Ray

Proceedings of the 45th IEEE Conference on Decision and Control, 2006

2005

Early detection of voltage imbalances in three-phase induction motors.

Rohan Samsi, Venkatesh Rajagopalan, Jeffrey Mayer, Asok Ray

Proceedings of the American Control Conference, 2005