Yingdi Liu

According to our database, Yingdi Liu authored at least 14 papers between 2016 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology.

Ashrith S. Harith, Yingdi Liu, Nilanjan Mukherjee, Jeffrey Mayer

Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024

2022

Two new stenosis detection methods of coronary angiograms.

Yaofang Liu, Xinyue Zhang, Wenlong Wan, Shaoyu Liu, Yingdi Liu, Hu Liu, Xueying Zeng, Qing Zhang

Int. J. Comput. Assist. Radiol. Surg., 2022

2021

Time and Area Optimized Testing of Automotive ICs.

Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

IEEE Trans. Very Large Scale Integr. Syst., 2021

X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan.

Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak

IEEE Trans. Very Large Scale Integr. Syst., 2021

Abnormal Behavior Recognition in Classroom Pose Estimation of College Students Based on Spatiotemporal Representation Learning.

Yunfang Xie, Su Zhang, Yingdi Liu

Traitement du Signal, 2021

Two New Stenoses Detection Methods of Coronary Angiograms.

Yaofang Liu, Xinyue Zhang, Wenlong Wan, Shaoyu Liu, Yingdi Liu, Hu Liu, Xueying Zeng, Qing Zhang

CoRR, 2021

A Knowledge Image Construction Method for Effective Information Filtering and Mining From Education Big Data.

Yunfang Xie, Peng Wen, Wenhui Hou, Yingdi Liu

IEEE Access, 2021

2020

Deterministic Stellar BIST for Automotive ICs.

Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

X-Tolerant Tunable Compactor for In-System Test.

Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak

Proceedings of the IEEE International Test Conference, 2020

2019

Test Time and Area Optimized BrST Scheme for Automotive ICs.

Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki

Proceedings of the IEEE International Test Conference, 2019

2018

Staggered ATPG with capture-per-cycle observation test points.

Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Deterministic Stellar BIST for In-System Automotive Test.

Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer

Proceedings of the IEEE International Test Conference, 2018

2017

Embedded Deterministic Test Points.

Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada

IEEE Trans. Very Large Scale Integr. Syst., 2017

2016

Minimal area test points for deterministic patterns.

Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer

Proceedings of the 2016 IEEE International Test Conference, 2016