Sylwester Milewski

According to our database, Sylwester Milewski authored at least 11 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A New Static Compaction of Deterministic Test Sets.

Stephan Eggersglüß, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer

IEEE Trans. Very Large Scale Integr. Syst., April, 2023

2021

Time and Area Optimized Testing of Automotive ICs.

Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

IEEE Trans. Very Large Scale Integr. Syst., 2021

X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan.

Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak

IEEE Trans. Very Large Scale Integr. Syst., 2021

Autonomous Scan Patterns for Laser Voltage Imaging.

Wu-Tung Cheng, Sylwester Milewski, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer

IEEE Trans. Emerg. Top. Comput., 2021

On Reduction of Deterministic Test Pattern Sets.

Stephan Eggersglüß, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer

Proceedings of the IEEE International Test Conference, 2021

2020

Low Cost Hypercompression of Test Data.

Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

X-Tolerant Tunable Compactor for In-System Test.

Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak

Proceedings of the IEEE International Test Conference, 2020

2019

Test Time and Area Optimized BrST Scheme for Automotive ICs.

Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki

Proceedings of the IEEE International Test Conference, 2019

2018

Hypercompression of Test Patterns.

Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang

Proceedings of the IEEE International Test Conference, 2018

2017

Full-scan LBIST with capture-per-cycle hybrid test points.

Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada

Proceedings of the IEEE International Test Conference, 2017

2014

Low Power Test Compression with Programmable Broadcast-Based Control.

Sylwester Milewski, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer

Proceedings of the 23rd IEEE Asian Test Symposium, 2014