Jedrzej Solecki

According to our database, Jedrzej Solecki authored at least 13 papers between 2010 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Time and Area Optimized Testing of Automotive ICs.

Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

IEEE Trans. Very Large Scale Integr. Syst., 2021

2019

Logic BIST With Capture-Per-Clock Hybrid Test Points.

Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Test Time and Area Optimized BrST Scheme for Automotive ICs.

Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki

Proceedings of the IEEE International Test Conference, 2019

2018

Staggered ATPG with capture-per-cycle observation test points.

Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2017

Trimodal Scan-Based Test Paradigm.

Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang

IEEE Trans. Very Large Scale Integr. Syst., 2017

Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns.

Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Full-scan LBIST with capture-per-cycle hybrid test points.

Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada

Proceedings of the IEEE International Test Conference, 2017

2015

Low-Power Programmable PRPG With Test Compression Capabilities.

Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

IEEE Trans. Very Large Scale Integr. Syst., 2015

A deterministic BIST scheme based on EDT-compressed test patterns.

Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer

Proceedings of the 2015 IEEE International Test Conference, 2015

TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm.

Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2012

Low power programmable PRPG with enhanced fault coverage gradient.

Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

J. Electron. Test., 2011

2010

Diagnosis of failing scan cells through orthogonal response compaction.

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

Proceedings of the 15th European Test Symposium, 2010