John Van Slyke

According to our database, John Van Slyke authored at least 2 papers between 2004 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Silicon evaluation of longest path avoidance testing for small delay defects.

Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke

Proceedings of the 2007 IEEE International Test Conference, 2007

2004

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.

Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004