Masamichi Suzuki

According to our database, Masamichi Suzuki authored at least 6 papers between 2010 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.

Harumi Seki, Reika Ichihara, Yusuke Higashi, Yasushi Nakasaki, Masumi Saitoh, Masamichi Suzuki

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2019

New Insights into the Imprint Effect in FE-HfO2 and its Recovery.

Yusuke Higashi, Karine Florent, A. Subirats, Ben Kaczer, Luca Di Piazza, Sergiu Clima, Nicolo Ronchi, Sean R. C. McMitchell, Kaustuv Banerjee, Umberto Celano, Masamichi Suzuki, Dimitri Linten, Jan Van Houdt

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2017

Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation.

Takao Marukame, Kodai Ueyoshi, Tetsuya Asai, Masato Motomura, Alexandre Schmid, Masamichi Suzuki, Yusuke Higashi, Yuichiro Mitani

IEEE Trans. Circuits Syst. II Express Briefs, 2017

Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface.

Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe

Microelectron. Reliab., 2017

2013

Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits.

Masamichi Suzuki, Atsuhiro Kinoshita, Yuichiro Mitani

Proceedings of 2013 International Conference on IC Design & Technology, 2013

2010

Detailed investigation of the effects of La and Al content on the electrical characteristics and reliability properties of La-Al-O gate dielectrics.

Masamichi Suzuki, Masato Koyama, Atsuhiro Kinoshita

Microelectron. Reliab., 2010