Mengkun Tian

According to our database1, Mengkun Tian authored at least 5 papers between 2024 and 2025.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2025
Understanding Correlation Between Memory Window Closure, Leakage and Read Delay Effects for FEFET Reliability Improvement: Role of IL and FE Traps.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

Multi-Scale Modeling-Driven Material to Device Co-Optimization of Ferroelectric Capacitors with Oxygen Reservoir Layer (ORL) for Improved Endurance.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

Comparative Study of Channel Materials for Ferroelectric NAND Applications.
Proceedings of the IEEE International Memory Workshop, 2025

2024
Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Design Framework for Ferroelectric Gate Stack Engineering of Vertical NAND Structures for Efficient TLC and QLC Operation.
Proceedings of the IEEE International Memory Workshop, 2024


  Loading...