Mengkun Tian
According to our database1,
Mengkun Tian
authored at least 5 papers
between 2024 and 2025.
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Bibliography
2025
Understanding Correlation Between Memory Window Closure, Leakage and Read Delay Effects for FEFET Reliability Improvement: Role of IL and FE Traps.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
Multi-Scale Modeling-Driven Material to Device Co-Optimization of Ferroelectric Capacitors with Oxygen Reservoir Layer (ORL) for Improved Endurance.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
Proceedings of the IEEE International Memory Workshop, 2025
2024
Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Design Framework for Ferroelectric Gate Stack Engineering of Vertical NAND Structures for Efficient TLC and QLC Operation.
Proceedings of the IEEE International Memory Workshop, 2024