Kwangyou Seo

According to our database, Kwangyou Seo authored at least 5 papers between 2025 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model.

Gyujun Jeong, Sungwon Cho, Minji Shon, Namhoon Kim, Woohyun Hwang, Kwangyou Seo, Suhwan Lim, Wanki Kim, Daewon Ha, Prasanna Venkatesan Ravindran, Kihang Youn, Ram Cherukuri, Yiyi Wang, Suman Datta, Asif Islam Khan, Shimeng Yu

CoRR, March, 2026

2025

An In-Situ Spatial-Temporal Sequence Detector for Neuromorphic Vision Sensor Empowered by High Density Vertical NAND Storage.

Zijian Zhao, Varun Darshana Parekh, Po-Kai Hsu, Yixin Qin, Yiming Song, A. N. M. Nafiul Islam, Ningyuan Cao, Siddharth Joshi, Thomas Kämpfe, Moonyoung Jung, Kwangyou Seo, Kwangsoo Kim, Wanki Kim, Daewon Ha, Sourav Dutta, Abhronil Sengupta, Xiao Gong, Shimeng Yu, Vijaykrishnan Narayanan, Kai Ni

CoRR, March, 2025

Retention Analysis of Ferroelectric FETs with Gate-Side Injection for Vertical NAND Storage.

Yixin Qin, Saikat Chakraborty, Zijian Zhao, Sizhe Ma, Moonyoung Jung, Kijoon Kim, Suhwan Lim, Kwangyou Seo, Kwangsoo Kim, Wanki Kim, Daewon Ha, Vijaykrishnan Narayanan, Jaydeep P. Kulkarni, Kai Ni

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Investigating Read-After-Write Delay in Ferroelectric FET with Gate-Side Injection.

Sizhe Ma, Saikat Chakraborty, Yixin Qin, Zijian Zhao, Jiahui Duan, Moonyoung Jung, Kijoon Kim, Suhwan Lim, Kwangyou Seo, Kwangsoo Kim, Wanki Kim, Daewon Ha, Vijaykrishnan Narayanan, Jaydeep P. Kulkarni, Kai Ni

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Comparative Study of Channel Materials for Ferroelectric NAND Applications.

Lance Fernandes, Prasanna Venkatesan Ravindran, Mengkun Tian, Yu-Hsin Kuo, Nashrah Afroze, Salma Soliman, Sanghyun Kang, Dyutimoy Chakraborty, Taeyoung Song, Chengyang Zhang, Kijoon Kim, Kwangyou Seo, Kwangsoo Kim, Wanki Kim, Daewon Ha, Shimeng Yu, Suman Datta, Asif Khan

Proceedings of the IEEE International Memory Workshop, 2025