Myungsoo Yeo

According to our database, Myungsoo Yeo authored at least 7 papers between 2020 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Introduction to Voltage-Ramping Wafer Level Electromigration Method and Current Exponent Correction Factor for Co-Capping Metal Lines.

Da Yong Shin, Hyunjun Choi, Joosung Kim, Myungsoo Yeo, Miji Lee, Taiki Uemura, Shin-Young Chung, Jong-Ho Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Reliability Impacts of Tapered Nanosheets and Localized Layout Effects in MBCFETs Fabricated with 2NM Logic Technology Featuring GAA.

Seongkyung Kim, Eunyu Choi, Jinyoung Kim, Junkyo Jeong, Jihun Ryu, Myungsoo Yeo, Taiki Uemura, Shin-Young Chung, Jong-Ho Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2025

The Impact of Silicon Concentration on the Reliability of Tungsten Silicide.

Liangshan Chen, Yinghong Zhao, Ki-Don Lee, Manisha Sharma, Joonah Yoon, Timothy Davis, Kayla N. Sanders, Myungsoo Yeo, Amado Longoria, Shou-Liang Zhang, Ju Kwang Kim, Dung Dau, Mukyeng Jung

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

Impacts of Post-Cu CMP Queue Time on Reliability.

Yinghong Zhao, Hokyung Park, Ki-Don Lee, Liangshan Chen, Manisha Sharma, Sugento Huandra, Hanson Mao, Brian Filemyr Smith, Wei Xia, Joonah Yoon, Junehwan Kim, Myungsoo Yeo, Shin-Young Chung, Ju Kwang Kim

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Polarity Dependency of MOL-TDDB in FinFET.

Manisha Sharma, Hokyung Park, Yinghong Zhao, Ki-Don Lee, Liangshan Chen, Joonah Yoon, Rakesh Ranjan, Caleb Dongkyan Kwon, Hyewon Shim, Myungsoo Yeo, Shin-Young Chung, Jon Haefner

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Polarity Dependence and Metal Density Impact on Multi-Layer Inter-Level TDDB for High Voltage Application.

Yinghong Zhao, Ki-Don Lee, Manisha Sharma, Joonah Yoon, Rakesh Ranjan, Md Iqbal Mahmud, Caleb Dongkyan Kwon, Myungsoo Yeo

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Reliability on EUV Interconnect Technology for 7nm and beyond.

Tae-Young Jeong, Miji Lee, Yunkyung Jo, Jinwoo Kim, Min Kim, Myungsoo Yeo, Jinseok Kim, Hyunjun Choi, Joosung Kim, Yoojin Jo, Yongsung Ji, Taiki Uemura, Hai Jiang, Dongkyun Kwon, HwaSung Rhee, Sangwoo Pae, Brandon Lee

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020