Naim Ben-Hamida

IEEE Trans. Circuits Syst. II Express Briefs, 2022

2021

An Area-Efficient High-Resolution Segmented ΣΔ-DAC for Built-In Self-Test Applications.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2021

New Charge-Steering DFEs in 55-nm CMOS.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2021

Delay-Locked Loop Based Multiphase Clock Generator for Time-Interleaved ADCs.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE International Conference on Electronics, 2021

2020

Low-Power Built-in Jitter Injection Using Linearized Phase Interpolator.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2020

Optimized Periodic ΣΔ Bitstreams for DC Signal Generation Used in Dynamic Calibration Applications.

[BibT_eX]

[DOI]

IEEE Open J. Circuits Syst., 2020

Using Optimized Butterworth-Based ΣΔ Bitstreams for the Testing of High-Resolution Data Converters.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE International New Circuits and Systems Conference, 2020

Seizure Prediction with a Single iEEG Electrode Using Non-linear Techniques.

[BibT_eX]

[DOI]

Proceedings of the 2020 International Symposium on Networks, Computers and Communications, 2020

Study on the Compensation of Silicon Photonics-Based Modulators in DCI Applications.

[BibT_eX]

[DOI]

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Partial Pre-Emphasis for Pluggable 400 G Short-Reach Coherent Systems.

[BibT_eX]

[DOI]

Future Internet, 2019

Adaptive Coherent Receiver Settings for Optimum Channel Spacing in Gridless Optical Networks.

[BibT_eX]

[DOI]

Future Internet, 2019

Selecting the Fastest Settling-Time Filter in PDM-based DACs used for Dynamic Calibration Applications.

[BibT_eX]

[DOI]

Proceedings of the 62nd IEEE International Midwest Symposium on Circuits and Systems, 2019

On the Design of DACs for Dynamic Calibration Applications using Periodic Sequences from ΣΔ Modulators.

[BibT_eX]

[DOI]

Proceedings of the 2019 IEEE Canadian Conference of Electrical and Computer Engineering, 2019

A 60 GS/s 8-b DAC with > 29.5dB SINAD up to Nyquist frequency in 7nm FinFET CMOS.

[BibT_eX]

[DOI]

Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019

2018

A coherent subsampling test system arrangement suitable for phase domain measurements.

[BibT_eX]

[DOI]

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Ultra-Broadband and Ultra-Compact Optical 90° Hybrid Based on 2×4 MMI Coupler with Subwavelength Gratings on Silicon-on-Insulator.

[BibT_eX]

[DOI]

Luhua Xu

Yun Wang

David Patel

Mohamed H. Morsy-Osman

Proceedings of the Optical Fiber Communications Conference and Exposition, 2018

New Charge-Steering Latches in 28nm CMOS for Use in High-Speed Wireline Transceivers.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

Framework for Developping Behavioural Models From Physical Designs.

[BibT_eX]

[DOI]

Proceedings of the 30th International Conference on Microelectronics, 2018

2015

Analysis and Modeling of the Phase Detector Hysteresis in Bang-Bang PLLs.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2015

2014

Epilepsy seizure prediction using graph theory.

[BibT_eX]

[DOI]

Proceedings of the IEEE 12th International New Circuits and Systems Conference, 2014

2013

A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution.

[BibT_eX]

[DOI]

Sadok Aouini

Jean-Francois Bousquet

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2011

A 56GS/S 6b DAC in 65nm CMOS with 256×6b memory.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Solid-State Circuits Conference, 2011

2010

A 40GS/s 6b ADC in 65nm CMOS.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Solid-State Circuits Conference, 2010

2009

Clock recovery for a 40 Gb/s QPSK optical receiver.

[BibT_eX]

[DOI]

Shing-Chi Wang

Chris Falt

Proceedings of the 16th IEEE International Conference on Electronics, 2009

2008

A 24GS/s 6b ADC in 90nm CMOS.

[BibT_eX]

[DOI]

Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008

2006

A 22GS/s 5b adc in 0.13µm SiGe BiCMOS.

[BibT_eX]

[DOI]

Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006

2001

Closing the gap between analog and digital testing.

[BibT_eX]

[DOI]

Khaled Saab

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001

2000

Parametric Fault Simulation and Test Vector Generation.

[BibT_eX]

[DOI]

Khaled Saab

Proceedings of the 2000 Design, 2000

Closing the gap between analog and digital.

[BibT_eX]

[DOI]

Khaled Saab

Proceedings of the 37th Conference on Design Automation, 2000

1997

A perturbation based fault modeling and simulation for mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996

LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

Testing of embedded A/D converters in mixed-signal circuit.

[BibT_eX]

[DOI]

Bechir Ayari

Proceedings of the 1996 International Conference on Computer Design (ICCD '96), 1996

1995

Automatic test vector generation for mixed-signal circuits.

[BibT_eX]

[DOI]

Bechir Ayari

Proceedings of the 1995 European Design and Test Conference, 1995

1994

Multiple Fault Testing in Analog Circuits.

[BibT_eX]

[DOI]

Proceedings of the Seventh International Conference on VLSI Design, 1994

Pseudo-Random Vector Compaction for Sequential Testability.

[BibT_eX]

[DOI]

Yvon Savaria

Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994

High Level Synthesis with Testability Constraints.

[BibT_eX]

[DOI]

Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994

1993

Multiple fault analog circuit testing by sensitivity analysis.

[BibT_eX]

[DOI]

J. Electron. Test., 1993

Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Initiability: A Measure of Sequential Testability.

[BibT_eX]