Nicolas Gerlin

According to our database, Nicolas Gerlin authored at least 7 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Modelling Peripheral Designs using FSM-like Notation for Complete Property Set Generation.

Endri Kaja, Nicolas Gerlin, Robert Kunzelmann, Keerthikumara Devarajegowda, Wolfgang Ecker

Proceedings of the 16th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip, 2023

Bits, Flips and RISCs.

Nicolas Gerlin, Endri Kaja, Fabian Vargas, Li Lu, Anselm Breitenreiter, Junchao Chen, Markus Ulbricht, Maribel Gomez, Ares Tahiraga, Sebastian Prebeck, Eyck Jentzsch, Milos Krstic, Wolfgang Ecker

Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

2022

MetFI: Model-driven Fault Simulation Framework.

Endri Kaja, Nicolas Gerlin, Luis Rivas, Monideep Bora, Keerthikumara Devarajegowda, Wolfgang Ecker

CoRR, 2022

Fast and Accurate Model-Driven FPGA-based System-Level Fault Emulation.

Endri Kaja, Nicolas Gerlin, Monideep Bora, Gabriel Rutsch, Keerthikumara Devarajegowda, Dominik Stoffel, Wolfgang Kunz, Wolfgang Ecker

Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022

Design of a Tightly-Coupled RISC-V Physical Memory Protection Unit for Online Error Detection.

Nicolas Gerlin, Endri Kaja, Monideep Bora, Keerthikumara Devarajegowda, Dominik Stoffel, Wolfgang Kunz, Wolfgang Ecker

Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022

MetaFS: Model-driven Fault Simulation Framework.

Endri Kaja, Nicolas Gerlin, Monideep Bora, Keerthikumara Devarajegowda, Dominik Stoffel, Wolfgang Kunz, Wolfgang Ecker

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Towards Fault Simulation at Mixed Register-Transfer/Gate-Level Models.

Endri Kaja, Nicolas Gerlin, Mounika Vaddeboina, Luis Rivas, Sebastian Siegfried Prebeck, Zhao Han, Keerthikumara Devarajegowda, Wolfgang Ecker

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021