Nikolaos Ioannis Deligiannis

According to our database, Nikolaos Ioannis Deligiannis authored at least 15 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT.

Nikolaos Ioannis Deligiannis, Tobias Faller, Riccardo Cantoro, Tobias Paxian, Bernd Becker, Matteo Sonza Reorda

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023

Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques.

Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matteo Sonza Reorda

Microprocess. Microsystems, April, 2023

Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters.

Josie E. Rodriguez Condia, Nikolaos Ioannis Deligiannis, Jacopo Sini, Riccardo Cantoro, Matteo Sonza Reorda

Proceedings of the High Performance Computing, 2023

Constraint-Based Automatic SBST Generation for RISC-V Processor Families.

Tobias Faller, Nikolaos Ioannis Deligiannis, Markus Schwörer, Matteo Sonza Reorda, Bernd Becker

Proceedings of the IEEE European Test Symposium, 2023

Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing.

Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda

Proceedings of the IEEE European Test Symposium, 2023

A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors.

Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner, Nusa Zidaric

Proceedings of the IEEE European Test Symposium, 2023

Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors.

Nikolaos Ioannis Deligiannis, Tobias Faller, Iacopo Guglielminetti, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms.

Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea

Proceedings of the 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 2022

Using Formal Methods to Support the Development of STLs for GPUs.

Nikolaos Ioannis Deligiannis, Tobias Faller, Josie E. Rodriguez Condia, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021

Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks.

Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea

IEEE Access, 2021

New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core.

Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matthias Sauer, Bernd Becker, Matteo Sonza Reorda

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques.

Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matteo Sonza Reorda

Proceedings of the 24th Euromicro Conference on Digital System Design, 2021

Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor.

Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Tobias Faller, Tobias Paxian, Bernd Becker, Matteo Sonza Reorda

Proceedings of the 30th IEEE Asian Test Symposium, 2021

2020

Evaluating the Code Encryption Effects on Memory Fault Resilience.

Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea

Proceedings of the IEEE Latin-American Test Symposium, 2020

Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network.

Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020