Denis Schwachhofer

According to our database, Denis Schwachhofer authored at least 11 papers between 2022 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2026

Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs.

Gabriele Filipponi, Denis Schwachhofer, Francesco Angione, Claudia Bertani, Simone Corbellini, Nicola Di Gruttola Giardino, Giuseppe Garozzo, Giorgio Insinga, Vincenzo Tancorre, Paolo Bernardi

IEEE Trans. Computers, February, 2026

2025

Large Language Models (LLMs) for Electronic Design Automation (EDA).

Kangwei Xu, Denis Schwachhofer, Jason Blocklove, Ilia Polian, Peter Domanski, Dirk Pflüger, Siddharth Garg, Ramesh Karri, Ozgur Sinanoglu, Johann Knechtel, Zhuorui Zhao, Ulf Schlichtmann, Bing Li

CoRR, August, 2025

Large Language Models (LLMs) for Electronic Design Automation (EDA) : Special Session Paper.

Kangwei Xu, Denis Schwachhofer, Jason Blocklove, Ilia Polian, Peter Domanski, Dirk Pflüger, Siddharth Garg, Ramesh Karri, Ozgur Sinanoglu, Johann Knechtel, Zhuorui Zhao, Ulf Schlichtmann, Bing Li

Proceedings of the 38th IEEE International System-on-Chip Conference, 2025

Exploring the Limits of LLMs for System-Level Test Program Generation: Can LLaMas Outrun Darwin?

Denis Schwachhofer, Steffen Becker, Stefan Wagner, Matthias Sauer, Ilia Polian

Proceedings of the 34th IEEE Asian Test Symposium, 2025

2024

Large Language Models to Generate System-Level Test Programs Targeting Non-functional Properties.

Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflüger, Ilia Polian

CoRR, 2024

Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties.

Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflüger, Ilia Polian

Proceedings of the IEEE European Test Symposium, 2024

Optimizing System-Level Test Program Generation via Genetic Programming.

Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian

Proceedings of the IEEE European Test Symposium, 2024

Large Language Model-Based Optimization for System-Level Test Program Generation.

Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflüger, Ilia Polian

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023

Automating Greybox System-Level Test Generation.

Denis Schwachhofer, Maik Betka, Steffen Becker, Stefan Wagner, Matthias Sauer, Ilia Polian

Proceedings of the IEEE European Test Symposium, 2023

A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors.

Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner, Nusa Zidaric

Proceedings of the IEEE European Test Symposium, 2023

2022

Intelligent Methods for Test and Reliability.

Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022