Nourhan Elhamawy

According to our database, Nourhan Elhamawy authored at least 5 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors.

Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner, Nusa Zidaric

Proceedings of the IEEE European Test Symposium, 2023

2022

Intelligent Methods for Test and Reliability.

Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Security, Reliability and Test Aspects of the RISC-V Ecosystem.

Jaume Abella, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker, Elke De Mulder, Nourhan Elhamawy, Frank K. Gürkaynak, Helena Handschuh, Carles Hernández, Michael Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer, Stefan Wagner, Francesco Regazzoni

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

An Open-Source Area-Optimized ECEG Cryptosystem in Hardware.

Nourhan Elhamawy, Maël Gay, Ilia Polian

Proceedings of the 2020 IEEE Computer Society Annual Symposium on VLSI, 2020

Exploring the Mysteries of System-Level Test.

Ilia Polian, Jens Anders, Steffen Becker, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner

Proceedings of the 29th IEEE Asian Test Symposium, 2020