Praveen Vishakantaiah

According to our database1, Praveen Vishakantaiah authored at least 12 papers between 1992 and 2001.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2001
A study of bridging defect probabilities on a Pentium (TM) 4 CPU.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

DPDAT: data path direct access testing.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000
Transparency-based hierarchical test generation for modular RTL designs.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

Modular test generation and concurrent transparency-based test translation using gate-level ATPG.
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference, 2000

1999
TRANSPARENT: a system for RTL testability analysis, DFT guidance and hierarchical test generation.
Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, 1999

1996
Distributed Mixed Level Logic and Fault Simulation on the Pentium® Pro Microprocessor.
Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1994
Impact of behavioral modifications for testability.
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

1993
Generation of testable designs from behavioral descriptions using high level synthesis tools.
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

CHEETA: Composition of Hierarchical Sequential Tests Using ATKET.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

AMBIANT: Automatic Generation of Behavioral Modifications for Testability.
Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

Impact of Behavioral Learning on the Compilation of Sequential Circuit Tests.
Proceedings of the Digest of Papers: FTCS-23, 1993

1992
Automatic Test Knowledge Extraction from VHDL (ATKET).
Proceedings of the 29th Design Automation Conference, 1992


  Loading...