J.-R. Vaillé

According to our database, J.-R. Vaillé authored at least 4 papers between 2013 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis.

Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné

Microelectron. Reliab., 2017

2013

Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET.

Alain Michez, Jerome Boch, S. Dhombres, Frédéric Saigné, Antoine D. Touboul, J.-R. Vaillé, Laurent Dusseau, E. Lorfèvre, R. Ecoffet

Microelectron. Reliab., 2013

Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model.

K. Guetarni, Antoine D. Touboul, Jerome Boch, L. Foro, A. Privat, Alain Michez, J.-R. Vaillé, Frédéric Saigné

Microelectron. Reliab., 2013

Characterization of an SRAM based particle detector for mixed-field radiation environments.

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné

Proceedings of the 5th IEEE International Workshop on Advances in Sensors and Interfaces, 2013