Frédéric Saigné

According to our database1, Frédéric Saigné authored at least 17 papers between 2005 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2020
Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects.
Proceedings of the IEEE Latin-American Test Symposium, 2020

Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning.
Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Effect of Temperature on Single Event Latchup Sensitivity.
Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

2018
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions.
Microelectron. Reliab., 2018

2017
A calculation method to estimate single event upset cross section.
Microelectron. Reliab., 2017

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis.
Microelectron. Reliab., 2017

2015
Real-time SRAM based particle detector.
Proceedings of the 6th International Workshop on Advances in Sensors and Interfaces, 2015

2013
Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET.
Microelectron. Reliab., 2013

Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model.
Microelectron. Reliab., 2013

Characterization of an SRAM based particle detector for mixed-field radiation environments.
Proceedings of the 5th IEEE International Workshop on Advances in Sensors and Interfaces, 2013

SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012
On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum.
Microelectron. Reliab., 2012

Evaluation of test algorithms stress effect on SRAMs under neutron radiation.
Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

2011
High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors.
Microelectron. Reliab., 2011

MC-ORACLE: A tool for predicting Soft Error Rate.
Comput. Phys. Commun., 2011

2005
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005


  Loading...