Razaidi Hussin

According to our database, Razaidi Hussin authored at least 9 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Generation of New Low-Complexity March Algorithms for Optimum Faults Detection in SRAM.

Aiman Zakwan Jidin, Razaidi Hussin, Lee Weng Fook, Mohd Syafiq Mispan, Nor Azura Zakaria, Loh Wan Ying, Norshuhani Zamin

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023

Novel March WY Approach for Dynamic Fault Detection in Memory BIST.

Loh Wan Ying, Weng Fook Lee, Razaidi Hussin, Aiman Zakwan Jidin, Norhawati Ahmad, Nor Azura Zakaria

Proceedings of the 16th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip, 2023

2021

Novel March Test Algorithm Optimization Strategy for Improving Unlinked Faults Detection.

Aiman Zakwan Jidin, Razaidi Hussin, Mohd Syafiq Mispan, Lee Weng Fook

Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2021

An Automation Program for March Algorithm Fault Detection Analysis.

Aiman Zakwan Jidin, Razaidi Hussin, Lee Weng Fook, Mohd Syafiq Mispan

Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2021

2020

Design of Multiplicative Inverse Value Generator using Logarithm Method for AES Algorithm.

Goh Yie Yen, Siti Zarina Md. Naziri, Rizalafande Che Ismail, Mohd Nazrin Md. Isa, Razaidi Hussin

Proceedings of the 32nd International Conference on Microelectronics, 2020

2015

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow.

Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marko Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov

Proceedings of the 45th European Solid State Device Research Conference, 2015

Experimental evidences and simulations of trap generation along a percolation path.

Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marko Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov

Proceedings of the 45th European Solid State Device Research Conference, 2015

2014

Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review.

Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov

Microelectron. Reliab., 2014

RTN distribution comparison for bulk, FDSOI and FinFETs devices.

Louis Gerrer, Salvatore M. Amoroso, Razaidi Hussin, Asen Asenov

Microelectron. Reliab., 2014