Pieter Weckx

According to our database, Pieter Weckx authored at least 60 papers between 2012 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

Impact of 3-D Integration on Thermal Performance of RISC-V MemPool Multicore SOC.

Sankatali Venkateswarlu, Subrat Mishra, Herman Oprins, Bjorn Vermeersch, Moritz Brunion, Jun-Han Han, Mircea R. Stan, Dwaipayan Biswas, Pieter Weckx, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., December, 2023

3D SRAM Macro Design in 3D Nanofabric Process Technology.

Dawit Burusie Abdi, Shairfe Muhammad Salahuddin, Jürgen Bömmels, Edouard Giacomin, Pieter Weckx, Julien Ryckaert, Geert Hellings, Francky Catthoor

IEEE Trans. Circuits Syst. I Regul. Pap., July, 2023

Block-level Evaluation and Optimization of Backside PDN for High-Performance Computing at the A14 node.

Giuliano Sisto, R. Preston, Rongmei Chen, Gioele Mirabelli, Anita Farokhnejad, Yun Zhou, Ivan Ciofi, Anne Jourdain, A. Veloso, Michele Stucchi, Odysseas Zografos, Pieter Weckx, Geert Hellings, Julien Ryckaert

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Impact of interconnects enhancement on SRAM design beyond 5nm technology node.

Mohit Kumar Gupta, Pieter Weckx, Manu Perumkunnil Komalan, Julien Ryckaert

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs).

Subrat Mishra, Sankatali Venkateswarlu, Bjorn Vermeersch, Moritz Brunion, Melina Lofrano, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Gaspard Hiblot, Geert Van der Plas, Pieter Weckx, Geert Hellings, James Myers, Francky Catthoor, Julien Ryckaert

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level.

Behnaz Ranjbar, Florian Klemme, Paul R. Genssler, Hussam Amrouch, Jinhyo Jung, Shail Dave, Hwisoo So, Kyongwoo Lee, Aviral Shrivastava, Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Francky Catthoor, Dwaipayan Biswas, Akash Kumar

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022

Thermal Performance Analysis of Mempool RISC-V Multicore SoC.

Sankatali Venkateswarlu, Subrat Mishra, Herman Oprins, Bjorn Vermeersch, Moritz Brunion, Jun-Han Han, Mircea R. Stan, Pieter Weckx, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2022

Evaluation of Nanosheet and Forksheet Width Modulation for Digital IC Design in the Sub-3-nm Era.

Giuliano Sisto, Odysseas Zografos, Bilal Chehab, Naveen Kakarla, Yang Xiang, Dragomir Milojevic, Pieter Weckx, Geert Hellings, Julien Ryckaert

IEEE Trans. Very Large Scale Integr. Syst., 2022

Multitimescale Mitigation for Performance Variability Improvement in Time-Critical Systems.

Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Alessio Spessot, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2022

Backside PDN and 2.5D MIMCAP to Double Boost 2D and 3D ICs IR-Drop beyond 2nm Node.

Rongmei Chen, Giuliano Sisto, Michele Stucchi, Anne Jourdain, Kenichi Miyaguchi, Pieter Schuddinck, P. Woeltgens, H. Lin, Naveen Kakarla, Anabela Veloso, Dragomir Milojevic, Odysseas Zografos, Pieter Weckx, Geert Hellings, Geert Van der Plas, Julien Ryckaert, Eric Beyne

Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

Opportunities of Chip Power Integrity and Performance Improvement through Wafer Backside (BS) Connection: Invited Paper.

Rongmei Chen, Giuliano Sisto, Odysseas Zografos, Dragomir Milojevic, Pieter Weckx, Geert Van der Plas, Eric Beyne

Proceedings of the 24th ACM/IEEE Workshop on System Level Interconnect Pathfinding, 2022

Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets.

Erik Bury, Adrian Vaisman Chasin, Ben Kaczer, Michiel Vandemaele, Stanislav Tyaginov, Jacopo Franco, Romain Ritzenthaler, Hans Mertens, Pieter Weckx, N. Horiguchi, Dimitri Linten

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Design enablement of CFET devices for sub-2nm CMOS nodes.

Odysseas Zografos, Bilal Chehab, Pieter Schuddinck, Gioele Mirabelli, Naveen Kakarla, Yang Xiang, Pieter Weckx, Julien Ryckaert

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

Proactive Run-Time Mitigation for Time-Critical Applications Using Dynamic Scenario Methodology.

Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Alessio Spessot, Francky Catthoor

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies.

Gerhard Rzepa, Markus Karner, Oskar Baumgartner, Georg Strof, Franz Schanovsky, Ferdinand Mitterbauer, Christian Kernstock, Hui-Wen Karner, Pieter Weckx, Geert Hellings, Dieter Claes, Zhicheng Wu, Yang Xiang, Thomas Chiarella, Bertrand Parvais, Jérôme Mitard, Jacopo Franco, Ben Kaczer, Dimitri Linten, Zlatan Stanojevic

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm.

Subrat Mishra, Pieter Weckx, Odysseas Zografos, Ji-Yung Lin, Alessio Spessot, Francky Catthoor

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors.

Loris Duch, Miguel Peón Quirós, Pieter Weckx, Alexandre Levisse, Rubén Braojos, Francky Catthoor, David Atienza

IEEE Trans. Very Large Scale Integr. Syst., 2020

Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS).

Subrat Mishra, Pieter Weckx, Ji-Yung Lin, Ben Kaczer, Dimitri Linten, Alessio Spessot, Francky Catthoor

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

eSRAM Reliability: Why is it still not optimally solved?

Daniël Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Mitigation of Sense Amplifier Degradation Using Skewed Design.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Device Scaling roadmap and its implications for Logic and Analog platform.

Alessio Spessot, Bertrand Parvais, Amita Rawat, Kenichi Miyaguchi, Pieter Weckx, Doyoung Jang, Julien Ryckaert

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020

2019

Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations.

Marko Simicic, Pieter Weckx, Bertrand Parvais, Philippe Roussel, Ben Kaczer, Georges G. E. Gielen

IEEE Trans. Very Large Scale Integr. Syst., 2019

Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM.

Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2019

Hardware-Based Aging Mitigation Scheme for Memory Address Decoder.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 24th IEEE European Test Symposium, 2019

Methodology for Application-Dependent Degradation Analysis of Memory Timing.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Comphy - A compact-physics framework for unified modeling of BTI.

Gerhard Rzepa, Jacopo Franco, Barry J. O'Sullivan, A. Subirats, Marko Simicic, Geert Hellings, Pieter Weckx, Markus Jech, Theresia Knobloch, Michael Waltl, Philippe Roussel, Dimitri Linten, Ben Kaczer, Tibor Grasser

Microelectron. Reliab., 2018

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability.

Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Vamsi Putcha, Erik Bury, Marko Simicic, Adrian Vaisman Chasin, Dimitri Linten, Bertrand Parvais, Francky Catthoor, Gerhard Rzepa, Michael Waltl, Tibor Grasser

Microelectron. Reliab., 2018

Impact and mitigation of SRAM read path aging.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Microelectron. Reliab., 2018

Self-heating-aware CMOS reliability characterization using degradation maps.

Erik Bury, Adrian Vaisman Chasin, Ben Kaczer, Kai-Hsin Chuang, Jacopo Franco, Marko Simicic, Pieter Weckx, Dimitri Linten

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Device aging: A reliability and security concern.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi

Proceedings of the 23rd IEEE European Test Symposium, 2018

Scaling CMOS beyond Si FinFET: an analog/RF perspective.

Bertrand Parvais, Geert Hellings, Marko Simicic, Pieter Weckx, Jérôme Mitard, Doyoung Jang, V. Deshpande, B. van Liempc, Anabela Veloso, A. Vandooren, Niamh Waldron, Piet Wambacq, Nadine Collaert, Diederik Verkest

Proceedings of the 48th European Solid-State Device Research Conference, 2018

Degradation analysis of high performance 14nm FinFET SRAM.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads.

Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Dedicated technology threshold voltage tuning for 6T SRAM beyond N7.

Mohit Kumar Gupta, Pieter Weckx, Stefan Cosemans, Pieter Schuddinck, Rogier Baert, Doyoung Jang, Yasser Sherazi, Praveen Raghavan, Alessio Spessot, Anda Mocuta, Wim Dehaene

Proceedings of the 2017 IEEE International Conference on IC Design and Technology, 2017

Device circuit and technology co-optimisation for FinFET based 6T SRAM cells beyond N7.

Mohit Kumar Gupta, Pieter Weckx, Stefan Cosemans, Pieter Schuddinck, Rogier Baert, Dmitry Yakimets, Doyoung Jang, Yasser Sherazi, Praveen Raghavan, Alessio Spessot, Anda Mocuta, Wim Dehaene

Proceedings of the 47th European Solid-State Device Research Conference, 2017

Mitigation of sense amplifier degradation using input switching.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2016

Accuracy of Quasi-Monte Carlo technique in failure probability estimations.

Michail Noltsis, Pieter Weckx, Dimitrios Rodopoulos, Francky Catthoor, Dimitrios Soudris

Proceedings of the International Conference on IC Design and Technology, 2016

Capturing True Workload Dependency of BTI-induced Degradation in CPU Components.

Dimitrios Stamoulis, Simone Corbetta, Dimitrios Rodopoulos, Pieter Weckx, Peter Debacker, Brett H. Meyer, Ben Kaczer, Praveen Raghavan, Dimitrios Soudris, Francky Catthoor, Zeljko Zilic

Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 2016

Read path degradation analysis in SRAM.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Proceedings of the 21th IEEE European Test Symposium, 2016

Comparative BTI analysis for various sense amplifier designs.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

2015

Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes.

Halil Kükner, Pieter Weckx, Sébastien Morrison, Jacopo Franco, Maria Toledano-Luque, Moonju Cho, Praveen Raghavan, Ben Kaczer, Doyoung Jang, Kenichi Miyaguchi, Marie Garcia Bardon, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Microprocess. Microsystems, 2015

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology.

Pieter Weckx, Ben Kaczer, C. Chen, Jacopo Franco, Erik Bury, K. Chanda, J. Watt, Philippe J. Roussel, Francky Catthoor, Guido Groeseneken

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Origins and implications of increased channel hot carrier variability in nFinFETs.

Ben Kaczer, Jacopo Franco, M. Cho, Tibor Grasser, Philippe J. Roussel, Stanislav Tyaginov, M. Bina, Yannick Wimmer, Luis-Miguel Procel, Lionel Trojman, Felice Crupi, Gregory Pitner, Vamsi Putcha, Pieter Weckx, Erik Bury, Z. Ji, An De Keersgieter, Thomas Chiarella, Naoto Horiguchi, Guido Groeseneken, Aaron Thean

Proceedings of the IEEE International Reliability Physics Symposium, 2015

BTI analysis of SRAM write driver.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 10th International Design & Test Symposium, 2015

Impact of time-dependent variability on the yield and performance of 6T SRAM cells in an advanced HK/MG technology.

Pieter Weckx, Ben Kaczer, Philippe J. Roussel, Francky Catthoor, Guido Groeseneken

Proceedings of the 2015 International Conference on IC Design & Technology, 2015

Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulations.

Azusa Oshima, Pieter Weckx, Ben Kaczer, Kazutoshi Kobayashi, Takashi Matsumoto

Proceedings of the 2015 International Conference on IC Design & Technology, 2015

The defect-centric perspective of device and circuit reliability - From individual defects to circuits.

Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser

Proceedings of the 45th European Solid State Device Research Conference, 2015

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow.

Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marko Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov

Proceedings of the 45th European Solid State Device Research Conference, 2015

Experimental evidences and simulations of trap generation along a percolation path.

Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marko Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov

Proceedings of the 45th European Solid State Device Research Conference, 2015

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

Characterization and simulation methodology for time-dependent variability in advanced technologies.

Pieter Weckx, Ben Kaczer, Praveen Raghavan, Jacopo Franco, Marko Simicic, Philippe J. Roussel, Dimitri Linten, Aaron Thean, Diederik Verkest, Francky Catthoor, Guido Groeseneken

Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015

2014

On reliability enhancement using adaptive core voltage scaling and variations on nanoscale FPGAs.

Petr Pfeifer, Zdenek Plíva, Pieter Weckx, Ben Kaczer

Proceedings of the 15th Latin American Test Workshop, 2014

Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology.

Halil Kukner, Moustafa A. Khatib, Sebastien Morrison, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes.

Halil Kukner, Pieter Weckx, Sebastien Morrison, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Proceedings of the 17th Euromicro Conference on Digital System Design, 2014

2013

Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model.

Halil Kükner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Microprocess. Microsystems, 2013

2012

Design of a 150 mV Supply, 2 MIPS, 90nm CMOS, Ultra-Low-Power Microprocessor.

Pieter Weckx, Nele Reynders, Ilse de Moffarts, Wim Dehaene

Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2012

Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model.

Halil Kukner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Proceedings of the 15th Euromicro Conference on Digital System Design, 2012