Salvatore M. Amoroso

According to our database1, Salvatore M. Amoroso authored at least 12 papers between 2012 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2024
Modeling and Simulation for DRAM and Flash Memory Technology Exploration and Development.
Proceedings of the IEEE International Memory Workshop, 2024

2018

2015
Comparison of Si < 100 > and < 110 > crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations.
Microelectron. Reliab., 2015

Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow.
Proceedings of the 45th European Solid State Device Research Conference, 2015

Experimental evidences and simulations of trap generation along a percolation path.
Proceedings of the 45th European Solid State Device Research Conference, 2015

2014
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review.
Microelectron. Reliab., 2014

RTN distribution comparison for bulk, FDSOI and FinFETs devices.
Microelectron. Reliab., 2014

FDSOI molecular flash cell with reduced variability for low power flash applications.
Proceedings of the 44th European Solid State Device Research Conference, 2014

2012
Modeling of statistical variability in nanoscale charge-trap flash memories.
PhD thesis, 2012

Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs.
Microelectron. Reliab., 2012

Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012


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