Ruijing Shen

According to our database, Ruijing Shen authored at least 14 papers between 2008 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Decentralized and Passive Model Order Reduction of Linear Networks With Massive Ports.

Boyuan Yan, Sheldon X.-D. Tan, Lingfei Zhou, Jie Chen, Ruijing Shen

IEEE Trans. Very Large Scale Integr. Syst., 2012

General Parameterized Thermal Modeling for High-Performance Microprocessor Design.

Thom Jefferson A. Eguia, Sheldon X.-D. Tan, Ruijing Shen, Duo Li, Eduardo H. Pacheco, Murli Tirumala, Lingli Wang

IEEE Trans. Very Large Scale Integr. Syst., 2012

Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems.

Ruijing Shen, Sheldon X.-D. Tan, Hai Wang, Jinjun Xiong

ACM Trans. Design Autom. Electr. Syst., 2012

A new voltage binning technique for yield improvement based on graph theory.

Ruijing Shen, Sheldon X.-D. Tan, Xuexin Liu

Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs.

Ruijing Shen, Sheldon X.-D. Tan, Hao Yu

Springer, ISBN: 978-1-4614-0787-4, 2012

2011

Statistical full-chip dynamic power estimation considering spatial correlations.

Zhigang Hao, Ruijing Shen, Sheldon X.-D. Tan, Bao Liu, Guoyong Shi, Yici Cai

Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

Performance bound analysis of analog circuits considering process variations.

Zhigang Hao, Sheldon X.-D. Tan, Ruijing Shen, Guoyong Shi

Proceedings of the 48th Design Automation Conference, 2011

2010

Variational Capacitance Extraction and Modeling Based on Orthogonal Polynomial Method.

Ruijing Shen, Sheldon X.-D. Tan, Jian Cui, Wenjian Yu, Yici Cai, Gengsheng Chen

IEEE Trans. Very Large Scale Integr. Syst., 2010

Statistical modeling and analysis of chip-level leakage power by spectral stochastic method.

Ruijing Shen, Sheldon X.-D. Tan, Ning Mi, Yici Cai

Integr., 2010

A linear statistical analysis for full-chip leakage power with spatial correlation.

Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong

Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010

General behavioral thermal modeling and characterization for multi-core microprocessor design.

Thom Jefferson A. Eguia, Sheldon X.-D. Tan, Ruijing Shen, Eduardo H. Pacheco, Murli Tirumala

Proceedings of the Design, Automation and Test in Europe, 2010

A linear algorithm for full-chip statistical leakage power analysis considering weak spatial correlation.

Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong

Proceedings of the 47th Design Automation Conference, 2010

2009

Statistical modeling and analysis of chip-level leakage power by spectral stochastic method.

Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong

Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009

2008

Variational capacitance modeling using orthogonal polynomial method.

Jian Cui, Gengsheng Chen, Ruijing Shen, Sheldon X.-D. Tan, Wenjian Yu, Jiarong Tong

Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, 2008