Shiho Hagiwara

According to our database, Shiho Hagiwara authored at least 12 papers between 2007 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Thermal Scaffolding for Ultra-Dense 3D Integrated Circuits.

Dennis Rich, Anna Kasperovich, Mohamadali Malakoutian, Robert M. Radway, Shiho Hagiwara, Takahide Yoshikawa, Srabanti Chowdhury, Subhasish Mitra

Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023

2014

State-Dependence of On-Chip Power Distribution Network Capacitance.

Koh Yamanaga, Shiho Hagiwara, Ryo Takahashi, Kazuya Masu, Takashi Sato

IEICE Trans. Electron., 2014

Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis.

Shiho Hagiwara, Takanori Date, Kazuya Masu, Takashi Sato

IEICE Trans. Electron., 2014

2010

Linear Time Calculation of On-Chip Power Distribution Network Capacitance Considering State-Dependence.

Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010

Linear time calculation of state-dependent power distribution network capacitance.

Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Robust importance sampling for efficient SRAM yield analysis.

Takanori Date, Shiho Hagiwara, Kazuya Masu, Takashi Sato

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis.

Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

2009

Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits.

Shiho Hagiwara, Takashi Sato, Kazuya Masu

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009

2008

Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network.

Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2008

2007

Weakness Identification for Effective Repair of Power Distribution Network.

Takashi Sato, Shiho Hagiwara, Takumi Uezono, Kazuya Masu

Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2007

A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.

Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

Improvement of power distribution network using correlation-based regression analysis.

Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu

Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, 2007