Sobeeh Almukhaizim

According to our database, Sobeeh Almukhaizim authored at least 37 papers between 2001 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

Predictive Techniques for Projecting Test Data Volume Compression.

Samah Mohamed Saeed, Ozgur Sinanoglu, Sobeeh Almukhaizim

IEEE Trans. Very Large Scale Integr. Syst., 2013

Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints.

Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu

J. Electron. Test., 2013

2011

Unified 2-D X-Alignment for Improving the Observability of Response Compactors.

Ozgur Sinanoglu, Sobeeh Almukhaizim

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits.

Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu

J. Low Power Electron., 2011

Novel hazard-free majority voter for n-modular redundancy-based fault tolerance in asynchronous circuits.

Sobeeh Almukhaizim, Ozgur Sinanoglu

IET Comput. Digit. Tech., 2011

Analysis of the soft error susceptibility and failure rate in logic circuits.

Eman AlQuraishi, May Al-Roomi, Sobeeh Almukhaizim

Int. Arab J. Inf. Technol., 2011

Error-resilient design of branch predictors for effective yield improvement.

Sobeeh Almukhaizim, Ozgur Sinanoglu

Proceedings of the 12th Latin American Test Workshop, 2011

2010

On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power.

Sobeeh Almukhaizim, Shouq Alsubaihi, Ozgur Sinanoglu

J. Electron. Test., 2010

Low-power test in compression-based reconfigurable scan architectures.

Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah

Proceedings of the 23rd Annual Symposium on Integrated Circuits and Systems Design, 2010

Predictive analysis for projecting test compression levels.

Ozgur Sinanoglu, Sobeeh Almukhaizim

Proceedings of the 2011 IEEE International Test Conference, 2010

Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG.

Junxia Ma, Mohammad Tehranipoor, Ozgur Sinanoglu, Sobeeh Almukhaizim

Proceedings of the 5th International Design and Test Workshop, 2010

Cost-free low-power test in compression-based reconfigurable scan designs.

Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Eman AlQuraishi

Proceedings of the 5th International Design and Test Workshop, 2010

Reconfigurable low-power Concurrent Error Detection in logic circuits.

Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu

Proceedings of the 5th International Design and Test Workshop, 2010

Test power reduction in compression-based reconfigurable scan architectures.

Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah

Proceedings of the 15th European Test Symposium, 2010

2009

X-Align: Improving the Scan Cell Observability of Response Compactors.

Ozgur Sinanoglu, Sobeeh Almukhaizim

IEEE Trans. Very Large Scale Integr. Syst., 2009

Soft-Error Tolerance and Mitigation in Asynchronous Burst-Mode Circuits.

Sobeeh Almukhaizim, Feng Shi, Eric Love, Yiorgos Makris

IEEE Trans. Very Large Scale Integr. Syst., 2009

Dynamic Scan Chain Partitioning for Reducing Peak Shift Power During Test.

Sobeeh Almukhaizim, Ozgur Sinanoglu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

X-alignment techniques for improving the observability of response compactors.

Ozgur Sinanoglu, Sobeeh Almukhaizim

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires.

Sobeeh Almukhaizim, Yiorgos Makris

IEEE Trans. Reliab., 2008

Peak Power Reduction Through Dynamic Partitioning of Scan Chains.

Sobeeh Almukhaizim, Ozgur Sinanoglu

Proceedings of the 2008 IEEE International Test Conference, 2008

On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD.

Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Coping with Soft Errors in Asynchronous Burst-Mode Machines.

Sobeeh Almukhaizim, Feng Shi, Yiorgos Makris

Proceedings of the 14th IEEE International Symposium on Asynchronous Circuits and Systems, 2008

2007

Concurrent Error Detection Methods for Asynchronous Burst-Mode Machines.

Sobeeh Almukhaizim, Yiorgos Makris

IEEE Trans. Computers, 2007

2006

Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines.

Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Seamless Integration of SER in Rewiring-Based Design Space Exploration.

Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris

Proceedings of the 2006 IEEE International Test Conference, 2006

Berger code-based concurrent error detection in asynchronous burst-mode machines.

Sobeeh Almukhaizim, Yiorgos Makris

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2005

Compaction-based concurrent error detection for digital circuits.

Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris

Microelectron. J., 2005

Concurrent Error Detection in Asynchronous Burst-Mode Controllers.

Sobeeh Almukhaizim, Yiorgos Makris

Proceedings of the 2005 Design, 2005

2004

Cost-Driven Selection of Parity Trees.

Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Concurrent Error Detection for Combinational and Sequential Logic via Output Compaction.

Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris

Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004

Compiler-Based Frame Formation for Static Optimization.

Feng Shi, Sobeeh Almukhaizim, Pey-Chang Lin, Yiorgos Makris

Proceedings of the 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 2004

On Concurrent Error Detection with Bounded Latency in FSMs.

Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris

Proceedings of the 2004 Design, 2004

2003

On Compaction-Based Concurrent Error Detection.

Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case.

Sobeeh Almukhaizim, Thomas Verdel, Yiorgos Makris

Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003

Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code.

Sobeeh Almukhaizim, Yiorgos Makris

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2001

Low-cost, software-based self-test methodologies for performance faults in processor control subsystems.

Sobeeh Almukhaizim, Peter Petrov, Alex Orailoglu

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001

Faults in Processor Control Subsystems: Testing Correctness and Performance Faults in the Data Prefetching Unit.

Sobeeh Almukhaizim, Peter Petrov, Alex Orailoglu

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001