Thomas Rinderknecht

According to our database, Thomas Rinderknecht authored at least 9 papers between 2003 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

On the Generation of Compact Deterministic Test Sets for BIST Ready Designs.

Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Thomas Rinderknecht

Proceedings of the 22nd Asian Test Symposium, 2013

2008

ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction.

Santiago Remersaro, Janusz Rajski, Thomas Rinderknecht, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

2007

Programmable Scan-Based Logic Built-In Self Test.

Liyang Lai, Wu-Tung Cheng, Thomas Rinderknecht

Proceedings of the 16th Asian Test Symposium, 2007

2006

Signature Based Diagnosis for Logic BIST.

Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht, Liyang Lai, Chris Hill

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Hardware Ef.cient LBISTWith Complementary Weights.

Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng

Proceedings of the 23rd International Conference on Computer Design (ICCD 2005), 2005

2004

Logic BIST Using Constrained Scan Cells.

Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Embedded Test for Low Cost Manufacturing.

Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Thomas Rinderknecht

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

Logic BIST with Scan Chain Segmentation.

Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

High-Frequency, At-Speed Scan Testing.

Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli

IEEE Des. Test Comput., 2003