Vladimír Székely

According to our database, Vladimír Székely authored at least 29 papers between 1993 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

Transformation between linear network features in convolution approach.

Vladimír Székely, Albin Szalai

Int. J. Circuit Theory Appl., 2015

2012

Measurement of the time-constant spectrum: Systematic errors, correction.

Vladimír Székely, Albin Szalai

Microelectron. J., 2012

Possible acception criteria for structure functions.

Albin Szalai, Vladimír Székely

Microelectron. J., 2012

2010

Editorial.

Vladimír Székely, Clemens J. M. Lasance

Microelectron. J., 2010

Evaluation of short pulse and short time thermal transient measurements.

Vladimír Székely

Microelectron. J., 2010

Fast field solver for the simulation of large-area OLEDs.

László Pohl, Zsolt Kohári, Vladimír Székely

Microelectron. J., 2010

2008

Contactless Thermal Characterization of High Temperature Test Chamber

Zoltán Szucs, György Bognár, Vladimír Székely, Márta Rencz

CoRR, 2008

Characterization and Modeling of an Electro-thermal MEMS Structure

Péter G. Szabó, Vladimír Székely

CoRR, 2008

2007

Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array

György Bognár, Vladimír Székely, Márta Rencz

CoRR, 2007

2006

Die Attach Quality Testing by Fully Contact-less Measurement Method.

György Bognár, Gyula Horváth, Zoltán Szucs, Vladimír Székely

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2004

Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03).

Vladimír Székely

Microelectron. J., 2004

2003

A Fast Algorithm for the Layout Based Electro-Thermal Simulation.

Márta Rencz, Vladimír Székely, András Poppe

Proceedings of the 2003 Design, 2003

2002

Enhancing reliability with thermal transient testing.

Vladimír Székely

Microelectron. Reliab., 2002

2000

IDDQ Testing of Submicron CMOS - by Cooling?

Márta Rencz, Vladimír Székely, S. Török, Kholdoun Torki, Bernard Courtois

J. Electron. Test., 2000

1999

Design and Test of MEMs.

Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

1998

Thermal Monitoring of Self-Checking Systems.

Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois

J. Electron. Test., 1998

Tracing the Thermal Behavior of ICs.

Vladimír Székely, Márta Rencz, Bernard Courtois

IEEE Des. Test Comput., 1998

Fast Field Solvers for Thermal and Electrostatic Analysis.

Vladimír Székely, Márta Rencz

Proceedings of the 1998 Design, 1998

1997

Electro-thermal and logi-thermal simulation of VLSI designs.

Vladimír Székely, András Poppe, Andras Pahi, Alpar Csendes, G. Hajas, Márta Rencz

IEEE Trans. Very Large Scale Integr. Syst., 1997

CMOS sensors for on-line thermal monitoring of VLSI circuits.

Vladimír Székely, Cs. Márta, Zsolt Kohári, Márta Rencz

IEEE Trans. Very Large Scale Integr. Syst., 1997

Integrating on-chip temperature sensors into DfT schemes and BIST architectures.

Vladimír Székely, Márta Rencz, Bernard Courtois

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Fast field solver-programs for thermal and electrostatic analysis of microsystem elements.

Vladimír Székely, Márta Rencz

Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, 1997

SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells.

Vladimír Székely, Andras Pahi, András Poppe, Márta Rencz, Alpar Csendes

Proceedings of the European Design and Test Conference, 1997

CAD and Foundries for Microsystems.

Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner

Proceedings of the 34st Conference on Design Automation, 1997

1996

An Efficient Method for the Self-Consistent Electro-Thermal Simulation and its Integration into a CAD Framework.

Vladimír Székely, András Poppe, Márta Rencz, Gabor Farkas, Alpar Csendes, Andras Pahi

Proceedings of the 1996 European Design and Test Conference, 1996

Applied design and analysis of microsystems.

Jean-Michel Karam, Bernard Courtois, András Poppe, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimír Székely

Proceedings of the 1996 European Design and Test Conference, 1996

Thermal Monitoring Of Safety-Critical Integrated Systems.

Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois

Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995

Thermal test and monitoring [microelectronic structures].

Vladimír Székely, Márta Rencz

Proceedings of the 1995 European Design and Test Conference, 1995

1993

Image recognition problems of fingerprint identification.

Éva Nikodémusz-Székely, Vladimír Székely

Microprocess. Microsystems, 1993