Márta Rencz

Microelectron. Reliab., 2018

To the special issue constructed from the selected papers of Thermal investigations of integrated circuits and systems, THERMINIC'17.

[BibT_eX]

[DOI]

Lorenzo Codecasa

Microelectron. Reliab., 2018

Joint international master in smart systems integration: University collaboration for improved education.

[BibT_eX]

[DOI]

Knut E. Aasmundtveit

Changhai Wang

Marc P. Y. Desmulliez

Ferenc Ender

Kristin Imenes

Proceedings of the 2018 IEEE Global Engineering Education Conference, 2018

2017

Thermal investigations of integrated circuits and systems, THERMINIC'16.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2017

An efficient reliability testing method combined with thermal performance monitoring.

[BibT_eX]

[DOI]

Gusztáv Hantos

Jozsef Hegedus

Microelectron. Reliab., 2017

2016

To the Special section constructed from the selected papers of Thermal investigations of integrated circuits and systems, THERMINIC'15.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2016

2015

Thermal investigations of integrated circuits and systems, THERMINIC'14.

[BibT_eX]

[DOI]

Microelectron. J., 2015

2014

Temperature dependent timing in standard cell designs.

[BibT_eX]

[DOI]

Microelectron. J., 2014

To the special issue from the selected papers of thermal investigations of integrated circuits and systems, THERMINIC'13.

[BibT_eX]

[DOI]

Microelectron. J., 2014

2013

Real-time heating and power characterization of cells in standard cell designs.

[BibT_eX]

[DOI]

Microelectron. J., 2013

Thermal investigations of integrated circuits in systems at THERMINIC'11.

[BibT_eX]

[DOI]

Microelectron. J., 2013

Thermal behaviour of new crystalline semitransparent solar cell structure.

[BibT_eX]

[DOI]

Eniko Bándy

Microelectron. J., 2013

High Resolution Temperature Dependent Timing Model in Digital Standard Cell Designs.

[BibT_eX]

[DOI]

J. Low Power Electron., 2013

2012

Characterization method for thermal interface materials imitating an in-situ environment.

[BibT_eX]

[DOI]

András Vass-Várnai

Zoltán Sárkány

Microelectron. J., 2012

Thermal investigations of integrated circuits and systems, THERMINIC'10.

[BibT_eX]

[DOI]

Microelectron. J., 2012

Acquiring real-time heating of cells in standard cell designs.

[BibT_eX]

[DOI]

Proceedings of the 13th Latin American Test Workshop, 2012

2011

Studying the Influence of Chip Temperatures on Timing Integrity Using Improved Power Modeling.

[BibT_eX]

[DOI]

J. Low Power Electron., 2011

Studying the influence of chip temperatures on timing integrity.

[BibT_eX]

[DOI]

Proceedings of the 12th Latin American Test Workshop, 2011

2009

Thermal transient characterisation of the etching quality of micro electro mechanical systems.

[BibT_eX]

[DOI]

Péter G. Szabó

Balázs Németh

Microelectron. J., 2009

Thermal investigations of integrated circuits in systems at THERMINIC'07.

[BibT_eX]

[DOI]

Microelectron. J., 2009

2008

Package Hermeticity Testing with Thermal Transient Measurements

[BibT_eX]

[DOI]

András Vass-Várnai

CoRR, 2008

Contactless Thermal Characterization of High Temperature Test Chamber

[BibT_eX]

[DOI]

CoRR, 2008

A novel method for fatigue testing of MEMS devices containing movable elements

[BibT_eX]

[DOI]

Zoltán Szucs

CoRR, 2008

Ni-MH battery modelling for ambient intelligence applications

[BibT_eX]

[DOI]

Domonkos Szente-Varga

Gyula Horváth

CoRR, 2008

Comparison of Two Low-Power Electronic Interfaces for Capacitive Mems Sensors

[BibT_eX]

[DOI]

CoRR, 2008

2007

Thermal investigations of integrated circuits in systems at THERMINIC'05.

[BibT_eX]

[DOI]

Microelectron. J., 2007

Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array

[BibT_eX]

[DOI]

György Bognár

CoRR, 2007

Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology

[BibT_eX]

[DOI]

CoRR, 2007

Design Issues of a Low Frequency Low-Pass Filter for Medical Applications Using CMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

2006

Foreword: Thermal investigations of integrated circuits and systems at THERMINIC'04.

[BibT_eX]

[DOI]

Microelectron. J., 2006

2003

Thermal investigations of integrated circuits and systems at THERMINIC'02.

[BibT_eX]

[DOI]

Microelectron. J., 2003

New possibilities in the thermal evaluation, offered by transient testing.

[BibT_eX]

[DOI]

Microelectron. J., 2003

A Fast Algorithm for the Layout Based Electro-Thermal Simulation.

[BibT_eX]

[DOI]

András Poppe

Proceedings of the 2003 Design, 2003

2000

IDDQ Testing of Submicron CMOS - by Cooling?

[BibT_eX]

[DOI]

J. Electron. Test., 2000

Towards design and validation of mixed-technology SOCs.

[BibT_eX]

[DOI]

Nacer-Eddine Zergainoh

Bernard Courtois

Ahmed Amine Jerraya

Proceedings of the 10th ACM Great Lakes Symposium on VLSI 2000, 2000

1999

Design and Test of MEMs.

[BibT_eX]

[DOI]

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

1998

Thermal Monitoring of Self-Checking Systems.

[BibT_eX]

[DOI]

J. Electron. Test., 1998

Tracing the Thermal Behavior of ICs.

[BibT_eX]

[DOI]

Bernard Courtois

IEEE Des. Test Comput., 1998

Fast Field Solvers for Thermal and Electrostatic Analysis.

[BibT_eX]

[DOI]

Proceedings of the 1998 Design, 1998

1997

Electro-thermal and logi-thermal simulation of VLSI designs.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 1997

CMOS sensors for on-line thermal monitoring of VLSI circuits.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 1997

Integrating on-chip temperature sensors into DfT schemes and BIST architectures.

[BibT_eX]

[DOI]

Bernard Courtois

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Fast field solver-programs for thermal and electrostatic analysis of microsystem elements.

[BibT_eX]

[DOI]

Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, 1997

SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells.

[BibT_eX]

[DOI]

Proceedings of the European Design and Test Conference, 1997

CAD and Foundries for Microsystems.

[BibT_eX]

[DOI]

Proceedings of the 34st Conference on Design Automation, 1997

1996

An Efficient Method for the Self-Consistent Electro-Thermal Simulation and its Integration into a CAD Framework.

[BibT_eX]

[DOI]

Proceedings of the 1996 European Design and Test Conference, 1996

Applied design and analysis of microsystems.

[BibT_eX]

[DOI]

Proceedings of the 1996 European Design and Test Conference, 1996

Thermal Monitoring Of Safety-Critical Integrated Systems.

[BibT_eX]

[DOI]

Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995

Thermal test and monitoring [microelectronic structures].

[BibT_eX]

[DOI]