Wei-Chun Wang

Orcid: 0009-0004-5081-1730

Affiliations:
  • Georgia Institute of Technology, Department of Electrical and Computer Engineering, Atlanta, GA, USA


According to our database1, Wei-Chun Wang authored at least 15 papers between 2023 and 2026.

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Timeline

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Bibliography

2026
A 256-Element Slepian Beamforming Accelerator With Analog Compute-In-Memory Multiplication and Accumulation.
IEEE Solid State Circuits Lett., 2026

A 92.5 TOPS/W Fully-Analog Multi-Layer Computing-in-Memory for State-Space Models in 28nm CMOS.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2026

2025
Broadband Beamforming Using Low-Bit Precision Dimensionality Reduction.
IEEE J. Sel. Top. Signal Process., September, 2025

Energy-Efficient and Reliable Sensor Platform Based on Analog-to-Feature Extraction.
IEEE Trans. Circuits Syst. Artif. Intell., June, 2025

MIX-ACIM: A 28-nm Mixed-Precision Analog Compute-in-Memory With Digital Feature Restoration for Vector-Matrix Multiplication.
IEEE Solid State Circuits Lett., 2025

Fully Digital Ultra-low-bit Linear Embedding Beamforming System with Quantization Compensation.
Proceedings of the IEEE Radio and Wireless Symposium, 2025

A Comparative Analysis of Aging Effects on Computing-in-Memory Systems in 28nm CMOS.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

Analog In-Memory-Compute with Multi-bit Silicon Ferro FinFET Array for Improved Energy and Area Efficiency.
Proceedings of the IEEE International Memory Workshop, 2025

2024
BeamCIM: A Compute-In-Memory based Broadband Beamforming Accelerator using Linear Embedding.
Proceedings of the IEEE Radio and Wireless Symposium, 2024

Cryogenic Operation of Computing-In-Memory based Spiking Neural Network.
Proceedings of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design, 2024

Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Cognitive Sensing for Energy-Efficient Edge Intelligence.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023
Energy-Efficient Sensor Platform using Reliable Analog-to-Feature Extraction.
Proceedings of the 2023 IEEE SENSORS, Vienna, Austria, October 29 - Nov. 1, 2023, 2023

AFE-CIM: A Current-Domain Compute-In-Memory Macro for Analog-to-Feature Extraction.
Proceedings of the 49th IEEE European Solid State Circuits Conference, 2023


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