Sofie Mertens

According to our database, Sofie Mertens authored at least 3 papers between 1999 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions.

Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2001

Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS.

M. Da Rold, Eddy Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere

Microelectron. Reliab., 2001

1999

Cost-effective cleaning and high-quality thin gate oxides.

Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke

IBM J. Res. Dev., 1999