Will Howell

Orcid: 0000-0002-8113-1533

According to our database1, Will Howell authored at least 2 papers between 2018 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2021
Defect-Oriented Test: Effectiveness in High Volume Manufacturing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2018
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies.
Proceedings of the IEEE International Test Conference, 2018


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