Wilfried Redemund

According to our database1, Wilfried Redemund authored at least 6 papers between 2010 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2018
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies.
Proceedings of the IEEE International Test Conference, 2018

2014
Cell-Aware Test.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Cell-aware experiences in a high-quality automotive test suite.
Proceedings of the 19th IEEE European Test Symposium, 2014

2012
Cell-aware Production test results from a 32-nm notebook processor.
Proceedings of the 2012 IEEE International Test Conference, 2012

2011
Cell-aware analysis for small-delay effects and production test results from different fault models.
Proceedings of the 2011 IEEE International Test Conference, 2011

2010
Defect-oriented cell-internal testing.
Proceedings of the 2011 IEEE International Test Conference, 2010


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