Anja Fast

According to our database, Anja Fast authored at least 4 papers between 2014 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Defect-Oriented Test: Effectiveness in High Volume Manufacturing.

Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2018

DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies.

Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski

Proceedings of the IEEE International Test Conference, 2018

2014

Cell-Aware Test.

Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Cell-aware experiences in a high-quality automotive test suite.

Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski

Proceedings of the 19th IEEE European Test Symposium, 2014