Friedrich Hapke

Orcid: 0000-0001-8744-3039

According to our database¹, Friedrich Hapke authored at least 35 papers between 2003 and 2021.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Timeline

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PhD thesis

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On csauthors.net:

Bibliography

2021

Defect-Oriented Test: Effectiveness in High Volume Manufacturing.

[BibT_eX]

[DOI]

Srikanth Venkataraman

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2018

DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies.

[BibT_eX]

[DOI]

Will Howell

Friedrich Hapke

Edward Brazil

Srikanth Venkataraman

Proceedings of the IEEE International Test Conference, 2018

Total Critical Area Based Testing.

[BibT_eX]

[DOI]

Friedrich Hapke

Peter C. Maxwell

Proceedings of the IEEE International Test Conference, 2018

2017

Bridge over troubled waters: Critical area based pattern generation.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE European Test Symposium, 2017

2016

On New Test Points for Compact Cell-Aware Tests.

[BibT_eX]

[DOI]

IEEE Des. Test, 2016

Cell-aware diagnosis: Defective inmates exposed in their cells.

[BibT_eX]

[DOI]

Peter C. Maxwell

Friedrich Hapke

Huaxing Tang

Proceedings of the 21th IEEE European Test Symposium, 2016

2015

Diagnosing timing related cell internal defects for FinFET technology.

[BibT_eX]

[DOI]

Proceedings of the VLSI Design, Automation and Test, 2015

Embedded deterministic test points for compact cell-aware tests.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Test Conference, 2015

2014

Cell-Aware Test.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Cell-aware experiences in a high-quality automotive test suite.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE European Test Symposium, 2014

Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models.

[BibT_eX]

[DOI]

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Industrial Application of IEEE P1687 for an Automotive Product.

[BibT_eX]

[DOI]

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

Fault collapsing of multi-conditional faults.

[BibT_eX]

[DOI]

Rene Krenz-Baath

Andreas Glowatz

Friedrich Hapke

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012

Cell-aware Production test results from a 32-nm notebook processor.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Test Conference, 2012

Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates.

[BibT_eX]

[DOI]

Friedrich Hapke

Jürgen Schlöffel

Proceedings of the 17th IEEE European Test Symposium, 2012

Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs.

[BibT_eX]

[DOI]

Proceedings of the 15th Euromicro Conference on Digital System Design, 2012

A new SAT-based ATPG for generating highly compacted test sets.

[BibT_eX]

[DOI]

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

EDA solutions to new-defect detection in advanced process technologies.

[BibT_eX]

[DOI]

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

Cell-aware analysis for small-delay effects and production test results from different fault models.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics.

[BibT_eX]

[DOI]

J. Electron. Test., 2010

Defect-oriented cell-internal testing.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Restrict Encoding for Mixed-Mode BIST.

[BibT_eX]

[DOI]

Abdul Wahid Hakmi

Stefan Holst

Hans-Joachim Wunderlich

Jürgen Schlöffel

Friedrich Hapke

Andreas Glowatz

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Using a two-dimensional fault list for compact Automatic Test Pattern Generation.

[BibT_eX]

[DOI]

Proceedings of the 10th Latin American Test Workshop, 2009

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.

[BibT_eX]

[DOI]

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

On Acceleration of SAT-Based ATPG for Industrial Designs.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

2007

Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults.

[BibT_eX]

[DOI]

Proceedings of the 5th ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2007), May 30, 2007

Programmable deterministic Built-In Self-Test.

[BibT_eX]

[DOI]

Abdul Wahid Hakmi

Hans-Joachim Wunderlich

Proceedings of the 2007 IEEE International Test Conference, 2007

Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International Test Conference, 2007

Experimental Studies on SAT-Based ATPG for Gate Delay Faults.

[BibT_eX]

[DOI]

Proceedings of the 37th International Symposium on Multiple-Valued Logic, 2007

2006

X-masking during logic BIST and its impact on defect coverage.

[BibT_eX]

[DOI]

Yuyi Tang

Hans-Joachim Wunderlich

IEEE Trans. Very Large Scale Integr. Syst., 2006

Fault detection and diagnosis with parity trees for space compaction of test responses.

[BibT_eX]

[DOI]

Proceedings of the 43rd Design Automation Conference, 2006

2005

PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits.

[BibT_eX]

[DOI]

Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

2004

X-Masking During Logic BIST and Its Impact on Defect Coverage.

[BibT_eX]

[DOI]

Yuyi Tang

Hans-Joachim Wunderlich

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Efficient Pattern Mapping for Deterministic Logic BIST.

[BibT_eX]

[DOI]

Valentin Gherman

Hans-Joachim Wunderlich

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Friedrich Hapke

Timeline

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On csauthors.net:

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