Yuan-Jen Lee

According to our database, Yuan-Jen Lee authored at least 4 papers between 2008 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2025

Failure Mechanism and Unified Endurance Model of Embedded MRAM Towards Cache Application.

Y. H. Chen, Yu-Sheng Chen, Yi Ching Ong, Y. L. Chu, Kuo-Feng Huang, Yuan-Jen Lee, C. Y. Wang, C. Y. Wu, W. H. Chuang, Allen Y. J. Wang, K. C. Huang, Harry Chuang

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

15.9 A 16nm 16Mb Embedded STT-MRAM with a 20ns Write Time, a 10¹² Write Endurance and Integrated Margin-Expansion Schemes.

Ku-Feng Lin, Hiroki Noguchi, Yi-Chun Shih, Perng-Fei Yuh, Yuan-Jen Lee, Tung-Cheng Chang, Sheng-Po Huang, Yu-Fan Lin, Chun-Ying Lee, Yen-Hsiang Huang, Jui-Che Tsai, Saman Adham, Peter Noel, Ramin Yazdi, Marat Gershoig, YangJae Shin, Vineet Joshi, Ted Wong, Meng-Ru Jiang, J. J. Wu, Chun-Tai Cheng, Yu-Jen Wang, Harry Chuang, Yu-Der Chih, Yih Wang, Tsung-Yung Jonathan Chang

Proceedings of the IEEE International Solid-State Circuits Conference, 2024

2021

Service Quality, Customer Satisfaction and Behavioral Intention in Shanghai Hospital Choice during the COVID-19 Pandemic.

Yuan-Jen Lee

Proceedings of the IMMS 2021: 4th International Conference on Information Management and Management Science, Chengdu, China, August 27, 2021

2008

Write Disturbance Modeling and Testing for MRAM.

Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ding-Yeong Wang, Yuan-Jen Lee, Ming-Jer Kao

IEEE Trans. Very Large Scale Integr. Syst., 2008