Ming-Jer Kao

According to our database, Ming-Jer Kao authored at least 12 papers between 2004 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

Set-Triggered-Parallel-Reset Memristor Logic for High-Density Heterogeneous-Integration Friendly Normally Off Applications.

Meng-Fan Chang, Shu-Meng Yang, Chia-Chen Kuo, Ting-Chin Yang, Che-Ju Yeh, Tun-Fei Chien, Li-Yue Huang, Shyh-Shyuan Sheu, Pei-Ling Tseng, Yu-Sheng Chen, Frederick T. Chen, Tzu-Kun Ku, Ming-Jinn Tsai, Ming-Jer Kao

IEEE Trans. Circuits Syst. II Express Briefs, 2015

2014

ReRAM-based 4T2R nonvolatile TCAM with 7x NVM-stress reduction, and 4x improvement in speed-wordlength-capacity for normally-off instant-on filter-based search engines used in big-data processing.

Li-Yue Huang, Meng-Fan Chang, Ching-Hao Chuang, Chia-Chen Kuo, Chien-Fu Chen, Geng-Hau Yang, Hsiang-Jen Tsai, Tien-Fu Chen, Shyh-Shyuan Sheu, Keng-Li Su, Frederick T. Chen, Tzu-Kun Ku, Ming-Jinn Tsai, Ming-Jer Kao

Proceedings of the Symposium on VLSI Circuits, 2014

A nonvolatile look-up table using ReRAM for reconfigurable logic.

Wen-Pin Lin, Shyh-Shyuan Sheu, Chia-Chen Kuo, Pei-Ling Tseng, Meng-Fan Chang, Keng-Li Su, Chih-Sheng Lin, Kan-Hsueh Tsai, Sih-Han Lee, Szu-Chieh Liu, Yu-Sheng Chen, Heng-Yuan Lee, Ching-Chih Hsu, Frederick T. Chen, Tzu-Kun Ku, Ming-Jinn Tsai, Ming-Jer Kao

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2014

2013

A High-Speed 7.2-ns Read-Write Random Access 4-Mb Embedded Resistive RAM (ReRAM) Macro Using Process-Variation-Tolerant Current-Mode Read Schemes.

Meng-Fan Chang, Shyh-Shyuan Sheu, Ku-Feng Lin, Che-Wei Wu, Chia-Chen Kuo, Pi-Feng Chiu, Yih-Shan Yang, Yu-Sheng Chen, Heng-Yuan Lee, Chen-Hsin Lien, Frederick T. Chen, Keng-Li Su, Tzu-Kun Ku, Ming-Jer Kao, Ming-Jinn Tsai

IEEE J. Solid State Circuits, 2013

Challenges of Cu CMP of TSVs and RDLs fabricated from the backside of a thin wafer.

Jui-Chin Chen, John H. Lau, Tzu-Chien Hsu, Chien-Chou Chen, Pei-Jer Tzeng, Po-Chih Chang, Chun-Hsien Chien, Yiu-Hsiang Chang, Shang-Chun Chen, Yu-Chen Hsin, Sue-Chen Liao, Cha-Hsin Lin, Tzu-Kun Ku, Ming-Jer Kao

Proceedings of the 2013 IEEE International 3D Systems Integration Conference (3DIC), 2013

2011

A 4Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability.

Shyh-Shyuan Sheu, Meng-Fan Chang, Ku-Feng Lin, Che-Wei Wu, Yu-Sheng Chen, Pi-Feng Chiu, Chia-Chen Kuo, Yih-Shan Yang, Pei-Chia Chiang, Wen-Pin Lin, Che-He Lin, Heng-Yuan Lee, Peiyi Gu, Sumin Wang, Frederick T. Chen, Keng-Li Su, Chen-Hsin Lien, Kuo-Hsing Cheng, Hsin-Tun Wu, Tzu-Kun Ku, Ming-Jer Kao, Ming-Jinn Tsai

Proceedings of the IEEE International Solid-State Circuits Conference, 2011

2010

Diagnosis of MRAM Write Disturbance Fault.

Chin-Lung Su, Chih-Wea Tsai, Ching-Yi Chen, Wan-Yu Lo, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, Ming-Jer Kao

IEEE Trans. Very Large Scale Integr. Syst., 2010

Low power design of phase-change memory based on a comprehensive model.

Meng-Hsueh Chiang, Yi-Bo Liao, Jun-Tin Lin, Wei-Chou Hsu, Chu Yu, Pei-Chia Chiang, Y.-Y. Hsu, W.-H. Liu, Shyh-Shyuan Sheu, Keng-Li Su, Ming-Jer Kao, Ming-Jinn Tsai

IET Comput. Digit. Tech., 2010

2008

Write Disturbance Modeling and Testing for MRAM.

Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ding-Yeong Wang, Yuan-Jen Lee, Ming-Jer Kao

IEEE Trans. Very Large Scale Integr. Syst., 2008

2007

Diagnosis for MRAM write disturbance fault.

Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, Ming-Jer Kao

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

Testing MRAM for Write Disturbance Fault.

Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ming-Jer Kao

Proceedings of the 2006 IEEE International Test Conference, 2006

2004

MRAM Defect Analysis and Fault Modeli.

Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004