Zdenek Plíva

Orcid: 0000-0003-1443-0960

According to our database1, Zdenek Plíva authored at least 12 papers between 2004 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2020
Detection of NAT64/DNS64 by SRV Records: Detection Using Global DNS Tree in the World Beyond Plain-Text DNS.
Proceedings of the Computer Networks - 27th International Conference, 2020

2018
Test response compaction method with improved detection and diagnostic abilities.
Microelectron. Reliab., 2018

2017
Logic testing with test-per-clock pattern loading and improved diagnostic abilities.
Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

Design and optimisation of NiTi pressure gauge.
Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

2014
A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices.
Microprocess. Microsystems, 2014

On reliability enhancement using adaptive core voltage scaling and variations on nanoscale FPGAs.
Proceedings of the 15th Latin American Test Workshop, 2014

2013
On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA).
Proceedings of the 23rd International Conference on Field programmable Logic and Applications, 2013

On performance estimation of a scalable VLIW soft-core in XILINX FPGAs.
Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012
On measurement of impact of the metallization and FPGA design to the changes of slice parameters and generation of delay faults.
Proceedings of the 22nd International Conference on Field Programmable Logic and Applications (FPL), 2012

2006
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead.
Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005
COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits.
Proceedings of the Dependable Computing, 2005

2004
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor.
J. Electron. Test., 2004


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