Zizhen Liu
Orcid: 0000-0002-8896-8600
According to our database1,
Zizhen Liu
authored at least 19 papers
between 2020 and 2025.
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Bibliography
2025
CoRR, April, 2025
A fast test compaction method using dedicated Pure MaxSAT solver embedded in DFT flow.
Integr., 2025
Proceedings of the 43rd IEEE VLSI Test Symposium, 2025
Proceedings of the Design, Automation & Test in Europe Conference, 2025
ETPG: Efficient Transition Fault Simulation via Dual-Strategy Pattern Parallelism and Gate Restructuring.
Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025
2024
UAFer: A Unified Model for Class-Agnostic Binary Segmentation With Uncertainty-Aware Feature Reassembly.
IEEE Trans. Circuits Syst. Video Technol., October, 2024
IEEE Trans. Inf. Forensics Secur., 2024
Efficient Functional Safety Method for Gate-Level Fine-Grained Digital Circuits with ISO-26262.
Proceedings of the IEEE International Test Conference in Asia, 2024
Proceedings of the IEEE International Test Conference in Asia, 2024
DDP-Fsim: Efficient and Scalable Fault Simulation for Deterministic Patterns with Two-Dimensional Parallelism.
Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, 2024
Alchemist: A Unified Accelerator Architecture for Cross-Scheme Fully Homomorphic Encryption.
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024
Accelerating Sequential Circuit Simulation with Spatial Locality Enhancement and Redundant Event Reduction.
Proceedings of the 33rd IEEE Asian Test Symposium, 2024
2023
A Cooperative Deception Strategy for Covert Communication in Presence of a Multi-Antenna Adversary.
IEEE Trans. Commun., August, 2023
DHSA: efficient doubly homomorphic secure aggregation for cross-silo federated learning.
J. Supercomput., 2023
An Empirical Study of the Inherent Resistance of Knowledge Distillation Based Federated Learning to Targeted Poisoning Attacks.
Proceedings of the 32nd IEEE Asian Test Symposium, 2023
2022
Proceedings of the Uncertainty in Artificial Intelligence, 2022
2021
2020
Proceedings of the 38th IEEE VLSI Test Symposium, 2020